Method and apparatus for measuring device mismatches

A system for testing an array of electronic devices, comprising:

• a plurality of column driver lines, each column driver line being connected to input nodes for a column of the electronic devices;
• a plurality of row output lines, each row output line being connected to output nodes for a row of the electronic devices;
• a plurality of driver/clamps which selectively drive at least one of said column driver lines with a drive voltage while connecting remaining column driver lines to a clamp voltage;
• a first plurality of individually addressable latches whose outputs control said driver/clamps;
• a measurement unit;
• a plurality of steering devices which selectively direct a current output for one of said row output lines to said measurement unit at a first side of the array which is opposite a second side of the array while directing current output from remaining row output lines to a sink;
• a first plurality of taps at the first side of the array which sense first voltages of said row output lines;
• a second plurality of individually addressable latches whose outputs control said steering devices and said first plurality of taps;
• a second plurality of taps at the second side of the array which sense second voltages of said row output lines;
• a third plurality of individually addressable latches whose outputs control said second plurality of taps;
• and
• an external interface which allows a user to set values in said addressable latches.