Cleaning solution for cleaning substrate for semiconductor devices and cleaning method using the same
AssigneeMitsubishi Chemical Corporation
InventorsMakoto Ikemoto, Yasuhiro Kawase, Hitoshi Morinaga
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AssigneeMitsubishi Chemical Corporation
InventorsMakoto Ikemoto, Yasuhiro Kawase, Hitoshi Morinaga
Estimating the term…
A cleaning solution for cleaning a substrate for semiconductor devices and a cleaning method using the said cleaning solution, which comprises at least the following components (A), (B) and (C): (A) an ethyleneoxide-type surfactant containing a hydrocarbon group which may have a substituent group except for phenyl, and a polyoxyethylene group in which a ratio (m/n) of a number (m) of carbon atoms contained in the hydrocarbon group to a number (n) of oxyethylene groups contained in the polyoxyethylene group is in the range of 1 to 1.5, the number (m) of carbon atoms is not less than 9, and the number (n) of oxyethylene groups is not less than 7; (B) water; and (C) alkali or an organic acid.
A method for cleaning a substrate for semiconductor devices comprising:
A cleaning solution for cleaning a substrate for semiconductor devices, comprising at least the following components (A), (B) and (C):
Dependencies are inferred from the claim text.