# US 7,613,966 B2 · Hyperjtag system including debug probe, on-chip instrumentation, and protocol

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 7,613,966 B2
- Document ID: US7613966B2
- Status: Granted
- Kind: B2
- Application number: 12/348,847
- Filed: 2009-01-05
- Published: 2009-05-07
- Granted: 2009-11-03
- Earliest claimed: 2003-12-29
- Assignees: MIPS Technologies, Inc.
- Inventors: Ernest Lewis Edgar; Bruce J. Ableidinger
- Web page: https://patentgrep.com/patent/US7613966B2

## CPC

- G01R 31/31907: {Modular tester, e.g. controlling and coordinating instruments in a bus based architecture}
- G06F 11/2236: {to test CPU or processors}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

A system for simultaneously interfacing multiple test instruments with multiple processor cores includes an on-chip instrumentation, a probe, and a connection mechanism for providing a transmission path between the probe and the on-chip instrumentation. The on-chip instrumentation includes an on-chip instrumentation concentrator and an on-chip instrumentation de-concentrator. The probe includes a probe concentrator and a probe de-concentrator. The probe concentrator concentrates signals from the test instruments into a first serial signal stream for transmission over the connector mechanism. The on-chip instrumentation de-concentrator de-concentrates the first serial signal stream into signals to be directed to at least one of the processor cores. The on-chip instrumentation concentrator concentrates signals from the processor cores into a second serial signal stream for transmission over the connector mechanism. The probe de-concentrator de-concentrates the second serial signal stream into signals to be directed to at least one of the testing instruments. Using this system, the testing instruments are able to simultaneously access and control respective processor cores. In one preferred embodiment the plurality of signals are directed to the processor cores using a plurality of loops, each loop having a chain of nodes, each of the processor cores connected to a respective node.

## Claims

### Claim 1

A port-sharing device, comprising:
multiple processor cores on a chip, at least a sub-set of processor cores being coupled to corresponding off-chip test probes, wherein communication of signals between a specific processor core of the sub-set of processor cores and a corresponding off-chip test probe is interleaved in time layers with signals from each of the remaining processor cores in the sub-set of processor cores, wherein processor cores of the sub-set of processor cores are independently and simultaneously controlled.

### Claim 2 (depends on 1)

The port-sharing device of claim 1 wherein the multiple processor cores comprise homogeneous processor cores.

### Claim 3 (depends on 1)

The port-sharing device of claim 1 wherein the multiple processor cores comprise heterogeneous processor cores.

### Claim 4 (depends on 1)

The port-sharing device of claim 1 wherein the multiple processor cores comprise a first group of homogeneous processor cores and a second group of heterogeneous processor cores.

### Claim 5 (depends on 1)

The port-sharing device of claim 1 wherein at least one off-chip test probe is a JTAG probe.