# US 7,613,591 B2 · Remote test facility with wireless interface to local facilities > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,613,591 B2 - Document ID: US7613591B2 - Status: Granted - Kind: B2 - Application number: 11/835,151 - Filed: 2007-08-07 - Published: 2007-11-22 - Granted: 2009-11-03 - Earliest claimed: 2004-12-21 - Assignees: FormFactor, Inc. - Inventors: Igor Y. Khandros; Benjamin N. Eldridge - Web page: https://patentgrep.com/patent/US7613591B2 ## CPC - G01R 31/2884: {using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/2855 takes precedence)} - G01R 31/31907: {Modular tester, e.g. controlling and coordinating instruments in a bus based architecture} - G01R 31/3025: {Wireless interface with the DUT} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices passed the testing. The central test facility may provide the results of the testing to other entities, such as a design facility where the electronic devices were designed or a manufacturing facility where the electronic devices where manufactured. The central test facility may accept requests for test resources from any of a number of local test facilities, schedule test times corresponding to each test request, and at a scheduled test time, wirelessly transmits test data to a corresponding local test facility. ## Claims ### Claim 1 A system comprising a central test facility comprising a wireless transceiver; a plurality of local test facilities remotely located from the central test facility, each comprising a test subsystem and a wireless transceiver, the test subsystem being capable of holding and testing an electronic device; wherein the central test facility is in wireless communication with the plurality of local test facilities via a wireless link and controls operation of the test subsystems using test data and response data exchanged between the central test facility and the plurality of local test facilities over the wireless link; and wherein the central test facility comprises means for scheduling testing at the plurality of local test facilities based on requests for test time received from ones of the plurality of local test facilities. ### Claim 2 (depends on 1) The system of claim 1, wherein at least one of the test subsystems comprises a prober. ### Claim 3 (depends on 1) The system of claim 1, wherein at least one of the test subsystems comprises an integrated circuit tester. ### Claim 4 (depends on 1) The system of claim 1, wherein at least one of the test subsystems comprises a burn in subsystem. ### Claim 5 (depends on 1) The system of claim 1, wherein the test subsystem comprises: means for processing test data received from the central test facility to test the electronic device; and means for generating response data based on testing of the electronic device for transmission to the central test facility. ### Claim 6 (depends on 1) The system of claim 1, wherein the central test facility further comprises means for analyzing the response data. ### Claim 7 (depends on 1) The system of claim 1, wherein the local test facility further comprise means for analyzing data from an electronic device under test to generate the response data. ### Claim 8 (depends on 1) The system of claim 1, wherein the test data comprises test vectors. ### Claim 9 (depends on 1) The system of claim 1, wherein the test data comprises test commands. ### Claim 10 (depends on 1) The system of claim 1, wherein the central test facility comprises a tester and the local test facilities each comprises a prober. ### Claim 11 (depends on 1) The system of claim 1, wherein a first local test facility comprises first testing equipment configured to test a first device type and a second local test facility comprises second testing equipment configured to test a second device type different from the first device type. ### Claim 12 (depends on 11) The system of claim 11, wherein the first testing equipment comprises a prober and the second testing equipment comprises a burn in facility. ### Claim 13 (depends on 11) The system of claim 11, wherein the first testing equipment comprises a die tester and the second testing equipment comprises a module tester. ### Claim 14 (depends on 1) The system of claim 1, further comprising a repeater as a part of the wireless link. ### Claim 15 (depends on 1) The system of claim 1, further comprising a satellite as a part of the wireless link. ### Claim 16 (depends on 1) The system of claim 1, wherein the wireless link is a long distance link. ### Claim 17 (depends on 1) The system of claim 1, wherein the wireless link is an optical link. ### Claim 18 (depends on 1) The system of claim 1, wherein the wireless link is a radio frequency link. ### Claim 19 (depends on 1) The system of claim 1, wherein the central test facility and the local test facilities occupy different floor space. ### Claim 20 (depends on 19) The system of claim 19, wherein the central test facility and the local test facilities are in different buildings. ### Claim 21 A system comprising a central test facility comprising a wireless transceiver; a plurality of local test facilities remotely located from the central test facility, each comprising a test subsystem and a wireless transceiver, the test subsystem being capable of holding and testing an electronic device; wherein the central test facility is in wireless communication with the plurality of local test facilities via a wireless link and controls operation of the test subsystems using test data and response data exchanged between the central test facility and the plurality of local test facilities over the wireless link; and wherein the central test facility comprises: a main controller; a plurality of test controllers in communication with the main controller via a communications bus, each test controller capable of controlling testing at ones of the plurality of local test facilities; and a storage unit in communications with the communications bus. ### Claim 22 (depends on 21) The system of claim 21, wherein the storage unit comprises any of a semiconductor based storage, a magnetic based storage, an optical-based storage, or combinations thereof. ### Claim 23 (depends on 21) The system of claim 21, wherein each of the plurality of test controllers corresponds to a different one of the plurality of local test facilities.