# US 7,613,047 B2 · Efficient circuit and method to measure resistance thresholds > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,613,047 B2 - Document ID: US7613047B2 - Status: Granted - Kind: B2 - Application number: 11/538,945 - Filed: 2006-10-05 - Published: 2008-04-10 - Granted: 2009-11-03 - Earliest claimed: 2006-10-05 - Assignees: International Business Machines Corporation - Inventors: Jonathan R. Fales; John A. Gabric; Muthukumarasamy Karthikeyan; Jeffery H. Oppold - Web page: https://patentgrep.com/patent/US7613047B2 ## CPC - G11C 7/067: {Single-ended amplifiers} - G11C 7/06: Sense amplifiers; Associated circuits {, e.g. timing or triggering circuits} - G11C 13/00: Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 - G11C 13/004: {Reading or sensing circuits or methods} - G11C 2213/79: Array wherein the access device being a transistor - G11C: STATIC STORES (semiconductor memory devices H10B) ## Abstract The embodiments of the invention provide an apparatus, method, etc. for an efficient circuit and method to measure resistance. A sense line driver for an integrated circuit memory is provided, including a sense node that receives an experiment signal from an experiment structure. An output device is connected to the sense node, wherein the output device amplifies the experiment signal. Further, a voltage divider is connected to the sense node, wherein the voltage divider includes a first device and a second device. A sensing range is controlled by an operating width/resistance range and/or an adjust signal of the second device. The adjust signal changes a gate to source voltage of the second device and holds a constant voltage over multiple sensing instances. The sensing range is different for each of the sensing instances due to a change in the operating width of the second device. ## Claims ### Claim 1 A sense amplifier for an integrated circuit memory, comprising: a voltage divider network from a sense node to a supply voltage, comprising a first device and a second device, wherein a sensing range of said sense amplifier is controlled by at least one of an operating width of said second device and an adjust signal of said second device; a third device adapted to allow a drive signal to propagate to an output device when a gate signal connected to an experiment structure is off; and a fourth device and a fifth device, wherein said fourth device and said fifth device are adapted to latch said sense amplifier. ### Claim 2 (depends on 1) The sense amplifier according to claim 1, wherein said adjust signal is adapted to hold a constant voltage over multiple sensing instances. ### Claim 3 (depends on 1) The sense amplifier according to claim 1, wherein said adjust signal is adapted to change resistive properties of said second device. ### Claim 4 (depends on 2) The sense amplifier according to claim 2, wherein said sensing range is different for each of said sensing instances due to a change in said operating width of said second device. ### Claim 5 A sense amplifier for an integrated circuit memory, comprising: a voltage divider network from a sense node to a supply voltage comprising a first device and a second device, wherein a sensing range of said sense amplifier is controlled by at least one of a resistance range of said second device and an adjust signal of said second device; a third device adapted to allow a drive signal to propagate to an output device when a gate signal connected to an experiment structure is off; and a fourth device and a fifth device, wherein said fourth device and said fifth device are adapted to latch said sense amplifier. ### Claim 6 (depends on 5) The sense amplifier according to claim 5, wherein said adjust signal is adapted to hold a constant voltage over multiple sensing instances. ### Claim 7 (depends on 5) The sense amplifier according to claim 5, wherein said adjust signal is adapted to change a gate to source voltage of said second device. ### Claim 8 (depends on 6) The sense amplifier according to claim 6, wherein said sensing range is different for each of said sensing instances due to a change in said resistance range of said second device. ### Claim 9 A sense line driver for an integrate circuit, comprising: a sense node adapted to receive an experiment signal from an experiment structure; an output device connected to said sense node, wherein said output device is adapted to amplify said experiment signal; and a voltage divider connected from said sense node to a supply voltage, to said sense node, wherein said voltage divider comprises a first device and a second device, and wherein a sensing range of said sense line driver is controlled by at least one of an operating width of said second device and an adjust signal of said second device. ### Claim 10 (depends on 9) The sense line driver according to claim 9, wherein said adjust signal is adapted to hold a constant voltage over multiple sensing instances. ### Claim 11 (depends on 9) The sense line driver according to claim 9, wherein said adjust signal is adapted to change a gate to source voltage of said second device. ### Claim 12 (depends on 9) The sense line driver according to claim 9, further comprising: a third device connected to said sense node, wherein said third device is adapted to allow a drive signal connected to said first device and said third device to propagate through said sense node to said output device when a gate signal connected to said experiment structure is off; and a fourth device and a fifth device connected to said adjust signal, wherein said fourth device and said fifth device are adapted to latch said sense line driver. ### Claim 13 (depends on 10) The sense line driver according to claim 10, wherein said sensing range is different for each of said sensing instances due to a change in said operating width of said second device. ### Claim 14 A method of measuring resistance of an integrated circuit device using a sense line driver, comprising: forming a voltage divider network from a sense node to a supply voltage, comprising a first device and a second device; and controlling a sensing range of said sense line driver by at least one of an operating width of said second device and an adjust signal of said second device; propagating a drive signal to an output device when a gate signal connected to an experiment structure is off; and latching said sense line driver. ### Claim 15 (depends on 14) The method according to claim 14, further comprising holding said adjust signal at a constant voltage over multiple sensing instances. ### Claim 16 (depends on 14) The method according to claim 14, further comprising changing a gate to source voltage of said second device via said adjust signal. ### Claim 17 (depends on 15) The method according to claim 15, further comprising differing said sensing range for each of said sensing instances, comprising changing said operating width of said second device.