# US 7,612,551 B2 · System of phonon spectroscopy

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 7,612,551 B2
- Document ID: US7612551B2
- Status: Granted
- Kind: B2
- Application number: 11/779,775
- Filed: 2007-07-18
- Published: 2008-01-31
- Granted: 2009-11-03
- Earliest claimed: 2006-07-21
- Assignees: Honeywell International Inc.
- Inventors: Mihai N. Mihaila
- Web page: https://patentgrep.com/patent/US7612551B2

## CPC

- G01N 21/00: Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence)
- G01N 21/65: Raman scattering
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A system for phonon spectroscopy for attaining a phonon spectrum of a sample of a material. Current may be injected into the material to result in electrical noise in the material. The electrical noise may be processed to result in information revealing a phonon spectrum of the material. The phonon spectrum may be useful for analyzing and monitoring various features of the material. Other information about the material may be obtained from the electrical noise.

## Claims

### Claim 1

A method of spectroscopy comprising:
providing a material;
measuring electrical noise of the material;
determining information about the material from the electrical noise; and
determining a second phonon spectrum of the material from a second parameter; and
wherein:
the electrical noise is a first parameter;
the phonon spectrum from the first parameter is a first phonon spectrum; and
the material is recognized by comparing the first phonon spectrum with the second phonon spectrum.

### Claim 2 (depends on 1)

The method of claim 1, wherein the information is a phonon spectrum.

### Claim 3 (depends on 1)

The method of claim 1, wherein the information is measurement of very low energy intermolecular vibration modes of molecules.

### Claim 4 (depends on 1)

The method of claim 1, further comprising sensing molecules located in a conductive matrix, from the electrical noise.

### Claim 5 (depends on 1)

The method of claim 1, further comprising applying a current through the material for providing the electrical noise.

### Claim 6 (depends on 1)

The method of claim 1, wherein the phonon spectrum is of a conductive material having an inorganic or organic nature.

### Claim 7 (depends on 1)

The method of claim 1, wherein the phonon spectrum is an indication of a vibration spectrum of a molecule.

### Claim 8 (depends on 1)

The method of claim 1, wherein the phonon spectrum is a bulk phonon spectrum.

### Claim 9 (depends on 1)

The method of claim 1, wherein the phonon spectrum is a surface vibration spectrum.

### Claim 10 (depends on 1)

The method of claim 1, wherein a modification of the phonon spectrum of a conductive material is determined from the electrical noise.

### Claim 11 (depends on 1)

The method of claim 1, wherein the phonon spectrum is an interface phonon spectrum of the material.

### Claim 12 (depends on 1)

The method of claim 1, wherein the phonon spectrum of a material is monitored.

### Claim 13 (depends on 1)

The method of claim 1, wherein the material is a nanoparticle.

### Claim 14 (depends on 1)

The method of claim 1, wherein the material is a nanoparticle film.

### Claim 15 (depends on 1)

The method of claim 1, wherein the material is a two-dimensional system of molecules and/or atoms.

### Claim 16 (depends on 1)

The method of claim 1, wherein the material is a system of nanotube contacts.

### Claim 17 (depends on 1)

The method of claim 1, wherein the material is a quantum dot.
