# US 7,611,631 B2 · Indium adsorbent and indium fractioning method

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- Number: US 7,611,631 B2
- Document ID: US7611631B2
- Status: Granted
- Kind: B2
- Application number: 11/631,898
- Filed: 2005-07-07
- Published: 2008-02-14
- Granted: 2009-11-03
- Earliest claimed: 2004-07-09
- Assignees: Aquatech Co., Ltd.; Sharp Kabushiki Kaisha
- Inventors: Akifusai Ohnishi; Nobuaki Fujiwara; Hideki Doi; Toyokazu Matsunami; Hiroshi Tsubota; Toshiaki Muratani; Shoji Nishikawa; Shinichi Yamasaki; Takamichi Honma
- Web page: https://patentgrep.com/patent/US7611631B2

## CPC

- C22B 58/00: Obtaining gallium or indium {(treatment or purification of solutions by liquid-liquid extraction, by ion-exchange or by adsorption C22B3/20)}
- B01J 20/26: Synthetic macromolecular compounds
- B01J 20/261: {obtained by reactions only involving carbon to carbon unsaturated bonds (macromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds per se C08F)}
- B01J 41/04: Processes using organic exchangers
- B01J 41/14: obtained by reactions only involving unsaturated carbon-to-carbon bonds
- C22B 3/42: by ion-exchange extraction
- Y02P 10/20: Recycling
- C22B: PRODUCTION AND REFINING OF METALS (electrolytic C25); PRETREATMENT OF RAW MATERIALS
- B01J: CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- Y02P: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS

## Abstract

The invention provides an indium adsorbent that can cause indium to be adsorbed, and a simple and inexpensive indium fractioning method for isolating and recovering high-purity indium from an acid solution whose primary component is hydrochloric acid and that contains indium. A primary component of the indium adsorbent is an anion-exchange resin that has a crosslinked structure produced by the copolymerization of styrene or acrylamide and divinylbenzene, and at least one of a quaternary ammonium group and a tertiary ammonium group, and that is provided with an acid-adsorbing ability. An acid solution whose primary component is hydrochloric acid and that includes indium is brought into contact with the anion-exchange resin to cause indium to be adsorbed to the anion-exchange resin.

## Claims

### Claim 1

An indium fractioning method comprising:
bringing an acid solution that has hydrochloric acid as a primary component and that contains indium into contact with an anion-exchange resin that has a crosslinked structure produced by copolymerization of styrene or acrylamide and divinylbenzene, and at least one of a quaternary ammonium group and a tertiary ammonium group, and that is provided with an acid-adsorbing ability, so as to cause indium to adsorb to the anion-exchange resin; and
after indium has been adsorbed onto the anion-exchange resin, bringing the anion-exchange resin into contact with water so as to desorb the indium from the anion-exchange resin, yielding an indium recovery liquid.

### Claim 2 (depends on 1)

The indium fractioning method according to claim 1,
wherein an acid concentration of the effluent after contact with the anion-exchange resin is measured, and an acid recovery liquid and the indium recovery liquid are fractioned off based on the change in its concentration.

### Claim 3 (depends on 1)

The indium fractioning method according to claim 1,
wherein the pH of the indium recovery liquid is adjusted so as to recover the indium as indium hydroxide.

### Claim 4 (depends on 2)

The indium fractioning method according to claim 2,
wherein the pH of the indium recovery liquid is adjusted so as to recover the indium as indium hydroxide.

### Claim 5 (depends on 3)

The indium fractioning method according to claim 3,
wherein the indium hydroxide that has been recovered is dried or eluted with acid.

### Claim 6 (depends on 4)

The indium fractioning method according to claim 4,
wherein the indium hydroxide that has been recovered is dried or eluted with acid.

### Claim 7 (depends on 1)

The indium fractioning method according to claim 1,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 8 (depends on 2)

The indium fractioning method according to claim 2,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 9 (depends on 3)

The indium fractioning method according to claim 3,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 10 (depends on 4)

The indium fractioning method according to claim 4,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 11 (depends on 5)

The indium fractioning method according to claim 5,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 12 (depends on 6)

The indium fractioning method according to claim 6,
wherein the acid solution is at least one of a solution obtained by eluting, with an acid whose primary component is hydrochloric acid, a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, an etching waste liquid of the conducting film, and a wash waste liquid of a chamber.

### Claim 13 (depends on 1)

The indium fractioning method according to claim 1,
wherein the acid solution is a mixture acid solution that includes nitric acid.

### Claim 14 (depends on 2)

The indium fractioning method according to claim 2,
wherein the acid recovery liquid is used for eluting at least one of a conducting film of a flat panel display, ITO attached matter or IZO attached matter that occur due to sputtering, or leadless solder that includes indium, or is used for washing a chamber.

### Claim 15 (depends on 7)

The indium fractioning method according to claim 7,
wherein the acid solution is a mixture acid solution that includes nitric acid.
