# US 7,611,377 B2 · Interface apparatus for electronic device test apparatus

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- Number: US 7,611,377 B2
- Document ID: US7611377B2
- Status: Granted
- Kind: B2
- Application number: 11/896,240
- Filed: 2007-08-30
- Published: 2008-03-27
- Granted: 2009-11-03
- Earliest claimed: 2006-09-22
- Assignees: Advantest Corporation
- Inventors: Shigeru Matsumura; Kazutaka Osawa; Hiroyuki Hama; Yuichiro Izumi
- Web page: https://patentgrep.com/patent/US7611377B2

## CPC

- H01R 31/06: Intermediate parts for linking two coupling parts, e.g. adapter (with a holder adapted for supporting apparatus to which its counterpart is attached H01R33/94)
- G01R 31/2889: {Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence)}
- H01R: ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66; a device side connector 541 attached to the other end of the electrical cable 54; and a intermediate connector 53 electrically connecting a test head side connector 41 provided on the test head 4 and the device side connector 541 and the intermediate connector 53 having a connector body 531 provided at a bottommost part of the interface apparatus 5; an engagement hole 532 provided at the connector body 531 and having the device side connector 541 detachably connected to it; and an output terminal 537 provided at the connector body 531 and having the test head side connector 41 detachably connected to it.

## Claims

### Claim 1

An interface apparatus mounted on a test head for testing a device under test and interconnecting an electrical connection between the device under test and the test head, wherein
the interface apparatus comprises:
an electrical cable having one end electrically connected to a measurement board electrically contacting the device under test;
a device side connector attached to the other end of the electrical cable; and
a plurality of intermediate connectors electrically connecting a test head side connector provided on the test head and the device side connector; and
a frame-shaped frame holding a plurality of the intermediate connectors, and each of the intermediate connectors has:
a housing held at the both ends of the housing by the frame;
a plurality of first connection parts provided at the housing and to which the device side connector is detachably connected, and
a plurality of second connection parts provided at the housing and to which the test head side connector is detachably connected
wherein a plurality of the intermediate connectors are collaterally arranged.

### Claim 2 (depends on 1)

The interface apparatus as set forth in claim 1, wherein the adjacent intermediate connectors are in close contact with each other.

### Claim 3 (depends on 2)

The interface apparatus as set forth in claim 2, wherein a plurality of the first connection parts are arranged in rows.

### Claim 4 (depends on 1)

The interface apparatus as set forth in claim 1, wherein
the device under test is a packaged semiconductor device, and
the measurement board is a socket board on which a socket electrically contacting the semiconductor device is mounted.

### Claim 5 (depends on 1)

The interface apparatus as set forth in claim 1, wherein
the device under test is a semiconductor device formed on a wafer, and
the measurement board is a probe card on which probe needles electrically contact the semiconductor device are mounted.

### Claim 6

An interface apparatus mounted on a test head for testing a device under test and interconnecting an electrical connection between the device under test and the test head, wherein the interface apparatus comprises:
an electrical cable having one end electrically connected to a measurement board electrically contacting the device under test;
a device side connector attached to the other end of the electrical cable; and
an intermediate connector electrically connecting a test head side connector provided on the test head and the device side connector, and
the intermediate connector has:
a connector body provided at a position adjoining the test head at the interface apparatus:
a first connection part provided at the connector body and to which the device side connector is detachably connected; and
a second connection part provided at the connector body and to which the test head side connector is detachably connected,
wherein the intermediate connector has a positioning pin or hole facing a positioning hole or pin which the test head side connector has.