# US 7,610,538 B2 · Test apparatus and performance board for diagnosis

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 7,610,538 B2
- Document ID: US7610538B2
- Status: Granted
- Kind: B2
- Application number: 11/734,792
- Filed: 2007-04-13
- Published: 2008-10-16
- Granted: 2009-10-27
- Earliest claimed: 2007-04-13
- Assignees: Advantest Corporation
- Inventors: Satoshi Iwamoto
- Web page: https://patentgrep.com/patent/US7610538B2

## CPC

- G06F 11/273: Tester hardware, i.e. output processing circuits {(G06F11/263 takes precedence)}
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

A test apparatus being capable of replacing a test module with the other kind of test module that tests device under tests by using the test module is provided. The test apparatus includes a plurality of test modules that transmit/receive signals to/from the device under tests to test the device under test; and a performance board for diagnosis that diagnose the plurality of test modules. The performance board for diagnosis including: a motherboard provided common to the plurality of test, modules; a circuit for diagnosis that transmits/receives a signal to/from each test module to diagnose the test module; a plurality of inter-board to module connectors that connect between the corresponding test module and the circuit for diagnosis; and plurality of sub-boards each of which has at least one of the inter-board to module connectors and is fixed to the motherboard to fix the inter-board to module connectors to the motherboard.

## Claims

### Claim 1

A test apparatus, configured such that a test module is replaceable with another kind of test module, that tests a device under test using the test module, comprising:
a plurality of test modules, including the test module and the another kind of test module, that transmit/receive signals to/from the device under test to test the device under test; and
a performance board for diagnosis that diagnoses the plurality of test modules, the performance board for diagnosis including:
a motherboard provided common to the plurality of test modules;
a circuit for diagnosis that transmits/receives a signal to/from each of the plurality of test modules to diagnose the plurality of test modules;
a plurality of inter-board to module connectors arranged corresponding to the plurality of test modules, each of which connects the corresponding test module to the circuit for diagnosis; and
a plurality of sub-boards each of which includes thereon at least one of the plurality of inter-board to module connectors and is replaceably fixed to the motherboard to fix the at least one of the plurality of inter-board to module connectors to the motherboard,
wherein each of the plurality of sub-boards has a fixing part which replaceably fixes each of the plurality of sub-boards to the motherboard, and
wherein each fixing part has substantially the same structure.

### Claim 2 (depends on 1)

The test apparatus as set forth in claim 1, wherein the circuit for diagnosis is provided on the motherboard and diagnoses the plurality of test modules, respectively.

### Claim 3 (depends on 2)

The test apparatus as set forth in claim 2, wherein the performance board for diagnosis has a plurality of connection parts that connect each of the plurality of sub-boards to the circuit for diagnosis, each of the plurality of connection parts having the same structure.

### Claim 4 (depends on 3)

The test apparatus as set forth in claim 3, wherein the the plurality of connection parts include:
a plurality of sub-board side connectors each of which is provided for one of the plurality of sub-boards and connected to one of the plurality of inter-board to module connectors; and
a plurality of motherboard side connectors arranged corresponding to the plurality of sub-boards one to one on the motherboard, each of which connects the sub-board side connector for which the corresponding sub-board is provided to the circuit for diagnosis.

### Claim 5 (depends on 4)

The test apparatus as set forth in claim 4, wherein
each of the plurality of inter-board to module connectors is designed so as to be electrically connectable to the corresponding test module, and
each of the plurality of sub-board side connectors has the same structure.

### Claim 6 (depends on 5)

The test apparatus as set forth in claim 5, wherein each of the plurality of motherboard side connectors has the same structure.

### Claim 7 (depends on 1)

The test apparatus as set forth in claim 1, wherein the performance board for diagnosis includes a plurality of circuits for diagnosis, each of which is provided on one of the plurality of sub-boards and diagnoses the test module connected to the sub-board.

### Claim 8 (depends on 7)

The test apparatus as set forth in claim 7, wherein each of the plurality of circuits for diagnosis independently operates for the sub-board.

### Claim 9 (depends on 2)

The test apparatus as set forth in claim 2, wherein each of the plurality of sub-boards further includes an identification information storage section that previously stores identification information for identifying the at least one of the plurality of inter-board to module connectors and notifies the circuit for diagnosis of the identification information.

### Claim 10

In a test apparatus, configured such that test module is replaceable with another kind of test module, that tests a device under test by using the test module, a performance board for diagnosis that diagnoses a plurality of test modules including the test module and the another kind of test module, the performance board for diagnosis comprising:
a motherboard provided common to the plurality of test modules;
a circuit for diagnosis that transmits/receives a signal to/from each of the plurality of test modules to diagnose the plurality of test modules;
a plurality of inter-board to module connectors arranged corresponding to the plurality of test modules, each of which connects the corresponding test module to the circuit for diagnosis; and
a plurality of sub-boards each of which includes thereon at least one of the plurality of inter-board to module connectors and is replaceably fixed to the motherboard to fix the at least one of the plurality of inter-board to module connectors to the motherboard,
wherein each of the plurality of sub-boards has a fixing part which replaceably fixes the each of the plurality of sub-boards to the motherboard, and
wherein each fixing part has substantially the same structure.
