# US 7,609,366 B2 · Material measurement system for obtaining coincident properties and related method

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- Number: US 7,609,366 B2
- Document ID: US7609366B2
- Status: Granted
- Kind: B2
- Application number: 11/941,574
- Filed: 2007-11-16
- Published: 2009-05-21
- Granted: 2009-10-27
- Earliest claimed: 2007-11-16
- Assignees: Honeywell International Inc.
- Inventors: Ross MacHattie; Frank M. Haran; Graham I. Duck; David R. Jez; Dan Gordon
- Web page: https://patentgrep.com/patent/US7609366B2

## CPC

- G01B 11/06: for measuring thickness {; e.g. of sheet material (thickness measurement by thermal means G01B21/085)}
- D21G 9/0036: {controlling the press or drying section}
- D21G 9/0045: {controlling the calendering or finishing}
- G01N 21/3554: for determining moisture content
- G01N 21/3581: using far infrared light; using Terahertz radiation
- G01N 21/86: Investigating moving sheets (G01N21/89 takes precedence)
- G01N 21/3559: in sheets, e.g. in paper
- G01N 21/3563: for analysing solids; Preparation of samples therefor
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- D21G: CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES (winders or rewinders for finished products, means for adjustment of wrinkles or lateral extensions B65H)
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A material measurement system (500) includes a THz generator including at least one laser source (111) for emitting optical pulses, the optical pulses coupled to a THz emitter (51) operable for emitting pulsed THz radiation at a sample location on material while being processed (14) by a manufacturing system. A receiver (52) is operable to receive the optical pulses and to detect reflected or transmitted THz radiation from the sample location (14) synchronously with the optical pulses and provide electrical detection signals. Synchronizing optics (112, 113, 114) is operable to receive the optical pulses from said laser and provide the optical pulses to both the receiver (52) and the THz emitter (51). A controller (25) includes at least one processor (87) for receiving the electrical detection signals and providing a processed electrical detection signal, and an analyzer (88) operable to determine at least one, and generally a plurality of properties of the material from the processed electrical detection signal.

## Claims

### Claim 1

A sheet material measurement system, comprising:
a THz generator including at least one laser source for emitting optical pulses, said optical pulses coupled to a THz emitter operable for emitting pulsed THz radiation at a first sample location on said sheet material while being processed by a manufacturing system;
a receiver operable to receive said optical pulses and to detect reflected or transmitted THz radiation from said first sample location synchronously with said optical pulses and provide electrical detection signals;
synchronizing optics operable to receive said optical pulses from said laser and provide said optical pulses to both said receiver and said THz emitter, and
a controller comprising at least one processor for receiving said electrical detection signals and providing a processed electrical detection signal and an analyzer operable to determine a plurality of different sheet material properties selected from the group consisting of basis weight, moisture content, thickness, composition and fiber orientation at said first sample location from said processed electrical detection signal.

### Claim 2 (depends on 1)

The system of claim 1, further comprising fiber optics, wherein said optical pulses are coupled from said laser source to at least one of said receiver and said transmitter by said fiber optics.

### Claim 3 (depends on 1)

The system of claim 1, wherein said optical pulses are coupled from said laser source to at least one of said receiver and said transmitter though free space.

### Claim 4 (depends on 1)

The system of claim 1, wherein said analyzer is operable to coincidently determine said plurality of different sheet material properties.

### Claim 5 (depends on 4)

The system of claim 4, wherein said plurality of different sheet material properties include said basis weight, said moisture content, said thickness, said composition and said fiber orientation.

### Claim 6 (depends on 1)

The system of claim 1, wherein said controller and said laser are both remotely located from said manufacturing system.

### Claim 7 (depends on 1)

The system of claim 1, wherein said controller comprises a multi-variable controller.

### Claim 8 (depends on 1)

The measurement system of claim 1, wherein said THz emitter and said receiver are combined in a single sensor module.

### Claim 9 (depends on 8)

The system of claim 8, further comprising fiber optics, wherein said optical pulses are coupled from said laser source to said single sensor module by said fiber optics, and a scanner coupled to said single sensor module for moving said single sensor module to obtain said plurality of different sheet material properties from a second sample location.

### Claim 10 (depends on 1)

The system of claim 1, wherein said receiver and said THz emitter are located on opposite sides of said sheet material, whereby said system is a transmission-based system.

### Claim 11 (depends on 1)

The system of claim 1, wherein said THz emitter and said receiver are both in fixed locations during operation of said system.

### Claim 12

A controlled system for forming sheet material, comprising:
a sheet material making system including a plurality of actuators;
a control system operatively coupled to said sheet material making system comprising a THz generator including at least one laser source for emitting optical pulses, said optical pulses coupled to a THz emitter operable for emitting pulsed THz radiation at a first sample location on sheet material being processed by said material masking system, a receiver operable to receive said optical pulses and to detect reflected or transmitted THz radiation from said first sample location synchronously with said optical pulses and provide electrical detection signals, synchronizing optics operable to receive said optical pulses from said laser and provide said optical pulses to both said receiver and said THz emitter, and a controller comprising at least one processor for receiving said electrical detection signals and providing a processed electrical detection signal, and an analyzer operable to determine a plurality of different sheet material properties selected from the group consisting of basis weight, moisture content, thickness, composition and fiber orientation at said first sample location from said processed electrical detection signal,
wherein said controller is operably linked to control operation of said sheet material making system using at least one of said plurality of actuators based on at least one of said plurality of different sheet material properties.

### Claim 13 (depends on 12)

The system of claim 12, wherein said THz emitter and said receiver are combined in a single sensor module.

### Claim 14 (depends on 12)

The system of claim 12, further comprising fiber optics, wherein said optical pulses are coupled from said laser source to at least one of said receiver and said transmitter by said fiber optics.

### Claim 15 (depends on 12)

The system of claim 12, wherein said sheet material making system comprises a paper making system comprising in serial connection a press section including at least one actuator arranged to control mechanical water removal from wetstock material to begin formation of a sheet material, a dryer section including at least one actuator arranged to control evaporative drying of said sheet material, a calendering stack including at least one actuator to control compressive pressure to said sheet material, and a take-up reel for producing a continuous roll of said sheet material.

### Claim 16

A method for in-situ quality control of sheet material processed by a manufacturing system, comprising the steps of:
directing THz radiation at a first sample location on material being processed by said manufacturing system;
measuring reflected radiation or transmitted radiation from said first sample location and generating electrical detection signals therefrom;
transmitting said electrical detection signals to a remotely located controller comprising at least one processor for receiving said electrical detection signals and providing a processed electrical detection signal;
determining a plurality of different sheet material properties selected from the group consisting of basis weight, moisture content, thickness, composition and fiber orientation at said first sample location from said processed electrical detection signal, and
automatically modifying at least one process parameter based on at least one of said plurality of different sheet material properties.

### Claim 17 (depends on 16)

The method of claim 16, wherein said plurality of different sheet material properties are determined from coincident measuring of said reflected radiation or transmitted radiation from said first sample location.

### Claim 18 (depends on 16)

The method of claim 16, wherein said THz emitter and said receiver are combined in a single sensor module, further comprising the step of scanning said single sensor module relative to said sheet material.

### Claim 19 (depends on 16)

The method of claim 16, wherein said measuring comprises synchronous measuring, said synchronous measuring synchronized with optical pulses from a laser source used to generate said THz radiation, said optical pulses fiber optically coupled to a THz generator for generating said THz radiation and a receiver for said measuring said reflected radiation or transmitted radiation.

### Claim 20 (depends on 16)

The method of claim 16, wherein said determining step comprises generating a time-domain spectroscopy (TDS) spectrum from said processed electrical detection signal.
