# US 7,609,081 B2 · Testing system and method for testing an electronic device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,609,081 B2 - Document ID: US7609081B2 - Status: Granted - Kind: B2 - Application number: 12/127,825 - Filed: 2008-05-28 - Published: 2009-05-21 - Granted: 2009-10-27 - Earliest claimed: 2007-11-16 - Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.; Hon Hai Precision Industry Co., Ltd. - Inventors: Shih-Fang Wong; Jiang-Feng Shan; Tsung-Jen Chuang; Wen-Wu Wang - Web page: https://patentgrep.com/patent/US7609081B2 ## CPC - G01R 31/2834: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signal, an instrument unit having a plurality of instruments, and a testing port having a plurality of probes. The plurality of probes connects corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port. The instrument unit processes a test result signal outputted by the electronic device and outputs a result data. The main controller receives the result data and computes whether the result data is within a predetermined range. A related testing method is also provided. ## Claims ### Claim 1 A testing system for measuring an electronic device, comprising: a main controller for generating a control signal; a signal generator for outputting a predetermined test input signal according to the control signal; an instrument unit comprising a plurality of instruments; and a testing port comprising a plurality of probes for connecting corresponding testing points of the electronic device to the signal generator and the instruments; wherein the predetermined test input signal is transmitted to the electronic device via the testing port, the instrument unit processes test result signals outputted by the electronic device and outputs a result data, and the main controller receives the result data and computes whether the result data is within a predetermined range; wherein the electronic device further comprises a switching unit comprising a plurality of switches for switching connections of the plurality of probes and the signal generator according to the control signal, the signal generator comprises a switching controller for generating a switching signal to control the switching actions of the plurality of switches according to the control signal. ### Claim 2 (depends on 1) The testing system as described in claim 1, wherein the predetermined test input signal comprises at least one of a predetermined current, voltage, and frequency. ### Claim 3 (depends on 1) The testing system as described in claim 1, wherein the plurality of switches is further configured for switching connections of corresponding probes and the instruments according to the control signal; at least one of the instruments measures the test result signals outputted by the electronic device via corresponding probes. ### Claim 4 (depends on 1) The testing system as described in claim 1, wherein the plurality of switches is controlled by relays. ### Claim 5 (depends on 1) The testing system as described in claim 1, wherein the signal generator further comprises a power supply circuit for generating the predetermined test input signal with at least one of a predetermined current and voltage. ### Claim 6 (depends on 5) The testing system as described in claim 5, wherein the signal generator further comprises an oscillating circuit for generating the predetermined test input signal with a predetermined frequency. ### Claim 7 A testing method capable of being implemented by a testing system for measuring an electronic device, the testing method comprising: generating a control signal by a main controller of the testing system; generating a test input signal by a signal generator of the testing system according to the control signal; generating a switching signal by the signal generator of the testing system to control switching actions of switches of the testing system according to the control signal; outputting the test input signal through a test port of the testing system to the electronic device; processing test result signals corresponding to the test input signal from the electronic device and outputting a result data by an instrument unit of the testing system; and computing the result data to determine whether the result data is within a predetermined range by the main controller. ### Claim 8 (depends on 7) The testing method as described in claim 7, further comprising: selecting an instrument of the instrument unit and connecting the instrument to a corresponding testing point of the electronic device by a switching unit of the testing system; enabling the instrument to measure the test result signals. ### Claim 9 (depends on 7) The testing method as described in claim 7, further comprising: enabling a switch of the switching unit to transmit the test input signal to a corresponding testing point of the electronic device. ### Claim 10 (depends on 7) The testing method as described in claim 7, wherein the test input signal comprises at least one of a predetermined current, voltage, and frequency. ### Claim 11 A testing system for testing an electronic device, the electronic device capable of being operated in an external power mode and a battery power mode, the testing system comprising: a main controller configured to generate a control signal in response to a test request; a signal generator operatively coupled to the main controller, the signal generator configured to generate a first set of test signals corresponding to the external power mode of the electronic device and a second set of test signals corresponding to the battery power mode of the electronic device according to the control signal received from the main controller; and a testing port coupled between the signal generator and the electronic device for selectively transmitting the first set of test signals to the electronic device to test the electronic device under the external power mode and the second set of test signals to the electronic device to test the electronic device under the battery power mode. ### Claim 12 (depends on 11) The testing system as described in claim 11, wherein the signal generator comprises a first power supply unit and a second power supply unit, the first power supply unit is configured to generate the first set of test signals according to the control signal received from the main controller, the second power supply unit is configured to generate the second set of test signals according to the control signal received from the main controller. ### Claim 13 (depends on 11) The testing system as described in claim 11, further comprising a switching unit, the signal generator comprising a switching controller coupled between the switching unit and the main controller, the switching controller configured to generate a switching signal according to the control signal to control switching actions of the switching unit.