# US 7,608,826 B2 · Specimen testing element, specimen information obtaining method and specimen testing apparatus > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,608,826 B2 - Document ID: US7608826B2 - Status: Granted - Kind: B2 - Application number: 11/468,063 - Filed: 2006-08-29 - Published: 2007-05-17 - Granted: 2009-10-27 - Earliest claimed: 2005-09-05 - Assignees: Canon Kabushiki Kaisha - Inventors: Takeaki Itsuji - Web page: https://patentgrep.com/patent/US7608826B2 ## CPC - G01N 22/00: Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (G01N3/00 - G01N17/00, G01N24/00 take precedence) - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract A specimen testing element, a specimen information obtaining method and a specimen testing apparatus is used to obtain information on a specimen by utilizing a specific phenomenon attributable to wavelength selectivity, resonance characteristics and so on. The specimen testing element obtains information on a specimen by utilizing a change in the propagation state of an electromagnetic wave propagating through a transmission path due to the existence of a specimen. A plurality of holding portions capable of holding a specimen are arranged substantially in a predetermined mode of regularity in part of a region in the transmission path where the propagating electromagnetic wave exists to form a specimen holding body. The specimen is filled in the plurality of holding portions by a specimen filling means and the electromagnetic wave propagating through the transmission path is detected by an electromagnetic wave detecting means. ## Claims ### Claim 1 A specimen testing element for obtaining information on a specimen by utilizing a change in the propagation state of an electromagnetic wave propagating through a transmission path due to an existence of the specimen, the electromagnetic wave having an appropriate band in a frequency range of 30 GHz to 30 THz, comprising: a plurality of holding portions, capable of holding a specimen, being arranged substantially in a predetermined mode of regularity to form a periodic structure having a wavelength selectivity attributable to a photonic band gap or a photonic fractal structure in part of a region in the transmission path where the propagating electromagnetic wave exists, wherein the transmission path has at least one conductor and a dielectric material and the plurality of holding portions are formed in the dielectric material, while the at least one conductor is formed to adhere to a surface of the dielectric material at least in order to confine the electromagnetic field to the sites where the plurality of holding portions exist. ### Claim 2 (depends on 1) The element according to claim 1, wherein the plurality of holding portions are formed by a silicon substrate of a cubic lattice type or of a Menger sponge type having many voids with a modulated refractive index in a predetermined space of the dielectric material. ### Claim 3 (depends on 1) The element according to claim 1, further comprising: coupling means for coupling an electromagnetic wave to the transmission path, said coupling means having an antenna structure or a grating structure to generate or detect an electromagnetic wave, to input an electromagnetic wave to the transmission path, or to output an electromagnetic wave from the transmission path. ### Claim 4 (depends on 1) A specimen testing apparatus comprising the specimen testing element according to claim 1, and further comprising: an ink jet system for jetting a specimen to the plurality of holding portions; electromagnetic wave generating means for propagating an electromagnetic wave through the transmission path; and electromagnetic wave detecting means for detecting an electromagnetic wave propagating through the transmission path. ### Claim 5 (depends on 4) The apparatus according to claim 4, further comprising: a database for storing information on specimens; a comparing section for collating the information of the database and electromagnetic wave information detected by the electromagnetic wave detecting means to obtain information on the specimen; and a presenting section for presenting the obtained information, wherein said presenting section includes a display apparatus for displaying an outcome of a comparison made by said comparing section. ### Claim 6 (depends on 4) The apparatus according to claim 4, further comprising: a database for storing information on specimens; a comparing section for collecting the information of the database and electromagnetic wave information detected by the electromagnetic wave detecting means to obtain information on the specimen; and a presenting section for presenting the obtained information, wherein said presenting section includes a light emitting element for notifying an outcome of a comparison made by said comparing section, by a change in a lighting state of the light emitting element. ### Claim 7 An element, comprising: a transmission path for allowing a terahertz wave to propagate through the transmission path, the transmission path having a dielectric material and a conductor adhering to the dielectric material, said dielectric material including a holding portion for holding a specimen, said holding portion being arranged so that a specimen held by said holding portion can interact with a terahertz wave propagating through the transmission path, wherein said holding portion forms a periodic structure having a wavelength selectivity attributable to a photonic band gap or a photonic fractal structure to show a physical property which is changeable depending on the specimen held by said holding portion. ### Claim 8 (depends on 7) The element according to claim 7, wherein said holding portion comprises a silicon substrate of a cubic lattice type or of a Menger sponge type having a plurality of voids with a modulated refractive index or having a structure showing a modulated refractive index when said holding portion holds a specimen. ### Claim 9 (depends on 7) A specimen testing apparatus for obtaining information on a specimen comprising: the element according to claim 7, and jetting means for jetting a specimen to said holding portion, wherein said specimen detecting apparatus detects a change in a propagation state of a terahertz wave propagating through the transmission path by utilizing a change in wavelength selectivity caused when said jetting means jets a specimen to said holding portion. ### Claim 10 (depends on 9) The apparatus according to claim 9, further comprising: electromagnetic wave detecting means for detecting an electromagnetic wave propagating through the transmission path; a database for storing information on specimens; a comparing section for collating the information of the database and an electromagnetic wave detected by said electromagnetic wave detecting means; an obtaining section for obtaining a frequency shift and a change in attenuation characteristic or frequency band width of the electromagnetic wave detected by said electromagnetic wave detecting means using an outcome from said comparing section; and a specimen material identifying section for identifying the material of the specimen using an outcome from said obtaining section. ### Claim 11 (depends on 7) The element according to claim 7, wherein the terahertz wave has an appropriate band in the frequency range of 30 GHz to 30 THz. ### Claim 12 (depends on 11) The element according to claim 11, further comprising: a gain material or an optical switch for generating the terahertz wave provided between a conductor of the transmission path and another conductor.