# US 7,607,931 B2 · Test socket adjustable to solid state image pickup devices of different sizes

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- Number: US 7,607,931 B2
- Document ID: US7607931B2
- Status: Granted
- Kind: B2
- Application number: 12/204,179
- Filed: 2008-09-04
- Published: 2009-03-19
- Granted: 2009-10-27
- Earliest claimed: 2007-09-14
- Assignees: Sharp Kabushiki Kaisha
- Inventors: Hitoshi Saitoh; Makoto Tsuji
- Web page: https://patentgrep.com/patent/US7607931B2

## CPC

- H01R 12/88: acting manually by rotating or pivoting connector housing parts
- H01R 13/627: Snap or like fastening
- H01R 2201/20: for testing or measuring purposes
- H01R: ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS

## Abstract

Provided is a test socket capable of being used more flexibly for solid-state image pickup devices of different shapes and of performing locating of the solid-state image pickup devices more precisely. The test socket houses a device under test (DUT) which is a solid-state image pickup device while a test is being performed. The test socket comprises: first locating means for locating the DUT in an X direction parallel to a ceiling plane of the DUT in a housed state; urging means for urging the first locating means in a Z direction perpendicular to the ceiling plane of the DUT in the housed state; and position setting means for setting an upper limit of movement in the Z direction of the first locating means caused by the urging means to set a position in the Z direction of the first locating means relative to the DUT.

## Claims

### Claim 1

A test socket for housing a device under test while a test is being performed, the device under test being a solid-state image pickup device, the test socket comprising:
a first locating portion for locating the device under test in a first direction parallel to a ceiling plane of the device under test in a housed state;
an urging portion for urging the first locating portion in a second direction perpendicular to the ceiling plane of the device under test in the housed state; and
a position setting portion for setting an upper limit of movement in the second direction of the first locating portion caused by the urging portion to set a position in the second direction of the first locating portion relative to the device under test.

### Claim 2 (depends on 1)

The test socket according to claim 1, wherein
the first locating portion comprises
a first fixing portion that is disposed on the test socket fixedly with respect to the first direction and supports a first corner which is one of corners on a diagonal of the device under test and
a second fixing portion that is provided in a slidable manner in a direction parallel to the diagonal of the device under test and urges, toward the first fixing portion, a second corner which is the other of the corners on the diagonal of the device under test.

### Claim 3 (depends on 1)

The test socket according to claim 1, wherein
the urging portion and a contact portion including a plurality of contact terminals to establish electrical connection with terminals of the device under test are provided at a side opposite in direction to the second direction with respect to the first locating portion, and wherein there is provided
a second locating portion for urging the device under test in a direction opposite to the second direction from a side along the second direction with respect to the first locating portion to fix a position of the ceiling plane of the device under test to a predetermined ceiling position.

### Claim 4 (depends on 3)

The test socket according to claim 3, wherein
the contact terminals are arranged in a matrix in the contact portion.