Landmark detection apparatus and method for intelligent system
AssigneeSamsung Electronics Co., Ltd.
InventorsWoo-Sup Han, Kyung-shik Roh, Woong Kwon, Young-bo Shim, Yeon-taek Oh, Ki-cheol Park
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AssigneeSamsung Electronics Co., Ltd.
InventorsWoo-Sup Han, Kyung-shik Roh, Woong Kwon, Young-bo Shim, Yeon-taek Oh, Ki-cheol Park
Estimating the term…
A landmark detection apparatus and method, the apparatus including a first detection unit that generates N first sample blocks in a first sampling region using a first weighted sampling method according to a first degree of dispersion, and that performs a first landmark detection by comparing a feature of each first sample block a feature of a landmark model, where the first sample region is set to the entirety of a current frame image; and a second detection unit that generates N second sample blocks in a second sampling region using a second weighted sampling method according to a second degree of dispersion, and that performs a second landmark detection by comparing a feature of each second sample block the feature of the landmark model, where the second sampling region is set to an area less than the entirety of the current frame image.
A landmark detection apparatus for an intelligent system, the apparatus comprising:
A landmark detection method for an intelligent system performed on a processor, the method comprising using the processor to perform a process comprising:
A tangible computer-readable recording medium for storing a program for performing a landmark detection method for an intelligent system, the method comprising:
Dependencies are inferred from the claim text.