Semiconductor device and method of manufacturing the same
AssigneeShinko Electric Industries Co., Ltd.
InventorsNaoyuki Koizumi, Masahiro Sunohara
Life of this patent
Estimating the term…
Loading patent…
AssigneeShinko Electric Industries Co., Ltd.
InventorsNaoyuki Koizumi, Masahiro Sunohara
Estimating the term…
In a method of manufacturing a semiconductor device having a through electrode 56 that connects an electrode pad 20 of a semiconductor element 14, which has a device forming layer 18 and the electrode pad 20 on one surface side, and a rewiring pattern 52 on other surface side of the semiconductor element 14, the device forming layer 18 and the electrode pad 20 are formed on an upper surface side of the semiconductor element 14, a first resist layer 62 is formed on surfaces of the electrode pad 20 and the device forming layer 18, an opening 64 is formed in the electrode pad 20 by the etching, and a through hole 54 is formed in the semiconductor element 14 by the etching in a position that is communicated with the opening 64. The device forming layer 18 is protected by the first resist layer 62, and also a flip-chip connection can be applied by providing the through electrode 56 to attain a downsizing.
A method of manufacturing a semiconductor device having a through electrode that connects an electrode pad of a semiconductor element, which has a device forming layer and the electrode pad on one surface side, and the other surface side of the semiconductor element, comprising:
A method of manufacturing a semiconductor device having a through electrode that connects an electrode pad of a semiconductor element, which has a device forming layer and the electrode pad on one surface side, and the other surface side of the semiconductor element, comprising:
Dependencies are inferred from the claim text.