Semiconductor device with stacked chips and method for manufacturing thereof
AssigneeQimonda AG
InventorsJuergen Simon, Harry Hedler
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a first semiconductor device and a second semiconductor device. Through-holes in the second semiconductor device extend from an upper side of the second semiconductor device adjacent contact pads to a bottom side of the second device. Tower contact bumps are electrically connected to contact pads of the first semiconductor device. The second semiconductor device is arranged adjacent the first semiconductor device so that the tower contact bumps are disposed within the through-holes and are electrically connected with contact pads of the second semiconductor device.
Claims16
A method for manufacturing a semiconductor device with stacked chips, the method comprising:
- providing a first semiconductor wafer with a first upper side and a first bottom side opposite to the first upper side, the first semiconductor wafer including first contact pads on the first upper side;
- providing a second semiconductor wafer with a second upper side and a second bottom side opposite to the second upper side, the second semiconductor wafer including second contact pads on the second upper side and having a thickness;
- forming through-holes into the second semiconductor wafer extending from the second upper side in an area of the second contact pads to the second bottom side;
- arranging tower contact bumps on the first contact pads, the tower contact pads having a diameter less than a diameter of the through-holes;
- stacking the second semiconductor wafer on the first semiconductor wafer wherein the second bottom side and the first upper side are relatively moved to each other and wherein the tower contact bumps are inserted into the through-holes;
- and
- electrically connecting the tower contact bumps with the second contact pads;
- wherein the second bottom side is provided with an adhesive layer thereby bonding the second bottom side on the first upper side when stacking and the second upper side is covered with a photosensitive dielectric coating after stacking thereby filling the space between the tower contact bumps and the walls of the through-holes with the photosensitive dielectric coating.
Dependencies are inferred from the claim text.