Microchip and analyzing method and device employing it

A microchip for analyzing a total reflection fluorescent X-ray, comprising:

• a substrate;
• a channel formed in the substrate;
• and
• an analyzing part consisting of a partial region of a flat surface of the substrate and including an outlet of the channel, wherein the outlet is formed as an opening within the flat surface of the substrate, and a measurement object liquid overflowed from the opening stays on the flat surface of the substrate to become a sample of analysis,
• wherein the analyzing part is defined by surroundings thereof subjected to a water-repellent surface treatment with fluororesin, has a circular or elliptic shape, and has a size configured to make a primary X-ray enter under total reflection conditions, and does not have undulations obstructing the total reflection within a region forming the analyzing part, and
• the outlet is disposed at a position offset from a center of the region.