Systems and methods of test case generation with feedback
AssigneeHewlett-Packard Development Company, L.P.
InventorChristopher Todd Weller
Life of this patent
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Abstract
Systems and methods for implementing test case generation with feedback are disclosed. An exemplary system for test case generation with feedback comprises a plurality of knobs identifying test values for a device under test. A plurality of buckets is each associated with at least one of the test values, each bucket having a weight value for the associated test value. A failure analysis module is operatively associated with the device under test, the failure analysis module changing at least some weight values based on feedback from test operations for the device under test. A test case generator selects test values for test operations based on the weight value for the associated test value.
Claims12
A system for test case generation with feedback, comprising:
- a plurality of knobs identifying test values for a device under test;
- a plurality of buckets each associated with at least one of the test values, each bucket having a weight value for the associated test value;
- a failure analysis module operatively associated with the device under test, the failure analysis module changing at least some weight values based on feedback from test operations for the device under test;
- and
- a test case generator selecting test values based on the weight value for the associated test value, the test values forming the test case for test operations on the device under test.
A computer program product encoding a computer program for executing a computer process for test case generation with feedback, the computer process comprising:
- weighting each of a plurality of knob settings for a device under test;
- changing the weighting based on test operations for the device under test;
- and
- selecting test values for test operations on the device under test based on the current weighting for the device under test.
Dependencies are inferred from the claim text.