System, method, and device including built-in self tests for communication bus device

A method of testing an electronic device, the method comprising:

• accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system;
• detecting a self-test descriptor associated with the configuration descriptor;
• testing a portion of the first device using test information associated with the self-test descriptor;
• testing the first device using a first test identifier associated with a first test;
• determining if the first device passed the first test;
• determining a second test identifier associated with a second test;
• testing the first device using the second test identifier;
• and
• determining if the first device passed the second test.

A method of testing an electronic device, the method comprising:

• accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system;
• detecting a self-test descriptor associated with the configuration descriptor;
• testing a portion of the first device using test information associated with the self-test descriptor;
• scanning a communication bus of the information handling system;
• detecting the first device is coupled to the communication bus during the scanning;
• sending a request to read the configuration descriptor;
• parsing the self-test descriptor and the configuration descriptor;
• enabling a test mode after parsing the self-test descriptor and the configuration descriptor;
• reading the test information from the configuration descriptor;
• determining a test identifier within the test information;
• and
• enabling the test mode to test the portion of the first device using the test identifier.