Back to results
US 7,598,763 B2Granted
Probe contacting electrode and electronic device
AssigneeEpson Toyocom Corporation
InventorShoichi Nagamatsu
Life of this patent
Estimating the term…
Abstract
A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer part made of a softer conductive material than a conductive material that forms the lower layer part.
Claims11
A probe contacting electrode comprising:
- a lower layer part;
- and
- an upper layer part made of a softer conductive material than a conductive material that forms the lower layer part;
- wherein the electrode is formed on a surface of a package of a piezoelectric device, the piezoelectric device having a frequency, and the electrode is formed such that a probe can contact the electrode to measure the frequency.
1 more element
Dependencies are inferred from the claim text.