Double ended contact probe
AssigneeUnitechno Inc.
InventorShinichi Nakamura
Life of this patent
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AssigneeUnitechno Inc.
InventorShinichi Nakamura
Estimating the term…
It is an object of the present invention to provide a double-ended contact probe that can be improved in productivity to ensure that the contact members are stably movable with respect to each other, and electrically connected to each other. The double-ended contact probe comprises first and second conductive members 11 and 12 constructed as electrical contact portions, an elastic member 13 made in the form of a hollow shape, the elastic member 13 intervening between the first and second conductive members 11 and 12 to urge the first and second conductive members 11 and 12 in respective directions opposite to each other when one of the first and second conductive members 11 and 12 approaches within a predetermined distance of the other of the first and second conductive members 11 and 12, and a third conductive member 14 accommodated in the elastic member 13, and disposed on a central axis, wherein the elastic member 13 has a pair of end portions for retaining the first and second conductive members 11 and 12, and an intermediate portion for retaining the third conductive member 14 to allow the third conductive member 14 to be pointed in a specific direction, and to be slidably movable with respect to each of the first and second conductive members 11 and 12.
A double-ended contact probe, comprising:
Dependencies are inferred from the claim text.