Probe navigation method and device and defect inspection device
AssigneeHitachi High-Technologies Corporation
InventorsTakashi Furukawa, Takayuki Mizuno, Eiichi Hazaki, Hirofumi Sato
Life of this patent
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Abstract
A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of skill are provided. To attain this object, probes and a test piece stage on which a test piece is placed are driven by independent driving means. Further, a large stage driving means which integrally drives the probes and the test piece stage is provided. In addition, CAD navigation is adopted. This enhances the equipment users' convenience during probing.
Claims18
A charged particle beam system for measuring electrical characteristics of a sample, comprising:
- a plurality of probes to detect an electrical current or voltage or electrical signal from the sample, each of the probes having a tip for contacting a sample;
- an electro-optical device to irradiate the sample with a charged particle beam and to obtain a second charged particle image by detection of a second charged particle beam resulting from irradiation of the sample;
- an electrical characteristics measuring instrument to measure the electrical characteristics of the sample based on the electrical current or the voltage or the electrical signal detected by the probe;
- a computer connected to a CAD image storing means for storing layout pattern of the sample, and
- a displaying unit for displaying the second charged particle image and a first CAD stored in the CAD image storing means such that the second charged particle image is lying on the first CAD.
A charged particle beam system for measuring electrical characteristics of a sample according to clam 1, wherein one can bring probes into contact with points to be inspected by watching the second particle image and the first CAD.
A charged particle beam system comprising:
- a plurality of probes to detect an electrical current or voltage or electrical signal from the sample, each of the probes having a tip to contact a sample;
- an electro-optical device to irradiate the sample with a charged particle beam and to obtain an image of the sample by detecting secondary charged particles resulting from irradiation of the charged particle beam;
- an electrical characteristics measuring instrument to measure the electrical characteristics of the sample based on the electrical current or the voltage or the electrical signal detected by the probe;
- a computer connected to a storage device to store a CAD image of layout pattern of the sample, and
- a display to display the image superimposed on the CAD image.
An electron beam system comprising:
- a plurality of probes to detect an electrical current or voltage or electrical signal from the sample, each of the probes having a tip to contact a sample;
- an electro-optical system to irradiate the sample with an electron beam and to obtain a SEM image of the sample by detecting secondary electrons resulting from irradiation of the electron beam;
- a measuring instrument to measure the electrical characteristics of the sample based on the electrical current or the voltage or the electrical signal detected by the probe;
- a computer connected to a storage device to store a CAD image of layout pattern of the sample, and
- a display to display the SEM image superimposed on the CAD image.
Dependencies are inferred from the claim text.