Integrated circuit with fuse programming damage detection
AssigneeXilinx, Inc.
InventorsBoon Yong Ang, Sunhom Paak, Hsung Jai Im, Kwansuhk Oh, Raymond C. Pang
Life of this patent
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Abstract
An integrated circuit with an efuse having an efuse link includes a damage detection structure disposed in relation to the efuse so as to detect damage in the IC resulting from programming the efuse. Damage sensing circuitry is optionally included on the IC. Embodiments are used in evaluation wafers to determine proper efuse fabrication and programming parameters, and in production ICs to identify efuse programming damage that might create a latent defect.
Claims20
An integrated circuit (“IC”) comprising:
- an efuse having a link;
- and
- a damage detection structure disposed in relation to the efuse so as to detect damage in portions of the IC other than the efuse which result from programming the efuse.
A method of detecting damage on an integrated circuit (“IC”) comprising:
- programming an efuse of the IC;
- and
- evaluating an efuse damage detection structure disposed in relation to the efuse so as to detect damage in portions of the IC other than the efuse which result from programming the efuse.
A system for detecting damage in an integrated circuit comprising:
- means for programming an efuse;
- means for detecting efuse programming damage disposed in relation to the efuse so as to detect efuse programming damage in portions of the integrated circuit other than the efuse which result from programming the efuse;
- and
- means for sensing efuse programming damage connected to the means for detecting efuse programming damage.
Dependencies are inferred from the claim text.