Integrated circuit including magneto-resistive structures
AssigneeInfineon Technologies AG
InventorsJürgen Zimmer, Klemens Prügl
Life of this patent
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Abstract
An integrated circuit includes two first adjacent magneto-resistive effect (xMR) structures. Each first xMR structure is configured to sense a first magnetic field direction. The integrated circuit includes two second adjacent xMR structures at a distance from the two first xMR structures. Each second xMR structure is configured to sense a second magnetic field direction. The two first xMR structures and the two second xMR structures are configured for in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.
Claims22
An integrated circuit comprising:
- two first adjacent magneto-resistive effect (xMR) structures, each first xMR structure configured to sense a first magnetic field direction;
- and
- two second adjacent xMR structures at a distance from the two first xMR structures, each second xMR structure configured to sense a second magnetic field direction;
- wherein the two first xMR structures and the two second xMR structures are configured for in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.
A sensor comprising:
- a transducer wheel configured to provide alternating magnetic fields;
- two first adjacent magneto-resistive effect (xMR) structures;
- two second adjacent xMR structures at a distance from the two first xMR structures such that a first magnetic field at the two first xMR structures provided by the transducer wheel is phase shifted by approximately 180° from a second magnetic field provided by the transducer wheel at the two second xMR structures;
- and
- means for providing in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures,
- wherein the two first xMR structures and the two second xMR structures are configured to measure magnetic field direction.
A method for measuring a magnetic field, the method comprising:
- providing two first adjacent magneto-resistive effect (xMR) structures and two second adjacent xMR structures configured to measure magnetic field direction;
- rotating a transducer to provide a first magnetic field at the two first xMR structures and to provide a second magnetic field phase shifted by approximately 180° from the first magnetic field at the two second xMR structures;
- and
- generating in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.
Dependencies are inferred from the claim text.