US 7,598,725 B2Granted

Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head

AssigneeTeradyne, Inc.

InventorsBrian J. Bosy, Craig A. DiPalo, Seth E. Mann, David W. Lewinnek, Michael A. Chiu

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Abstract

An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.

Claims10

Dependent claims

A method for docking a test head, comprising:

receiving positional information from a sensor regarding a position of a peripheral relative to a test head, at least one of the group of the test head and the peripheral supported by a manipulator;
and
automatically moving the test head relative to the peripheral, in position to enable docking of the test head to the peripheral by instructing the manipulator to move at least one of the group of the test head and the peripheral relative to the other of the group;
wherein the sensor comprises an alignment receptacle adapted to interact with a pin to generate relative positional data along at least two transverse axes;
and
wherein the step of receiving positional information from the sensor comprises receiving the relative positional data along at least two transverse axes generated by the sensor.

3 more elements

Dependencies are inferred from the claim text.