Semiconductor device having vertical channels and method of manufacturing the same
AssigneeSamsung Electronics Co., Ltd.
InventorsYong-Sung Kim, Tae-Yong Chung, Soo-Ho Shin
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AssigneeSamsung Electronics Co., Ltd.
InventorsYong-Sung Kim, Tae-Yong Chung, Soo-Ho Shin
Estimating the term…
A method of manufacturing a semiconductor device which can prevent leakage current caused by gate electrodes intersecting element isolation layers in a major axis of an active region, and which further has vertical channels to provide a sufficient overlap margin, and a semiconductor device manufactured using the above method. The device includes gate electrodes formed on element isolation layers that are disposed between active regions and have top surfaces that are higher than the top surfaces of the active regions. Since the gate electrodes are formed on the element isolation layers, leakage current in a semiconductor substrate is prevented. In addition, the gate electrodes are formed using a striped shape mask pattern, thereby obtaining a sufficient overlap margin compared to a contact shape or bar shape pattern.
A semiconductor device having vertical channels, the device comprising:
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