Charged-particle beam system
AssigneeJEOL Ltd.
InventorsHidetaka Sawada, Fumio Hosokawa
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Abstract
An aberration for correcting higher-order aberrations with a relatively small number of components is by let N1 being the aberration order at a first location, S1 being the symmetry at the first location, N2 being the aberration order at a second location and S2 being the symmetry at the second location. The produced combination aberration satisfies the following condition set 1 as order=N1+N2−1 and symmetry=|S1+S2| or |S2−S1|. That is two aberration-correcting elements (aberration-introducing elements) corresponding to the first and second locations, respectively. An aberration satisfying the condition set 1 is corrected by making use of the produced combination aberration.
Claims8
A charged-particle beam system comprising:
- an aberration corrector for correcting lower-order aberrations possessed by a lens disposed in the direction of travel of an electron beam;
- and
- at least two aberration-correcting elements spaced apart from each other along a path of travel of the electron beam,
- wherein a higher-order aberration left in said lens after the lower-order aberrations possessed by the lens have been corrected by said aberration corrector is corrected using a combination aberration created by a combination of aberrations produced in said at least two aberration-correcting elements.
A charged-particle beam system comprising:
- an aberration corrector for correcting lower-order aberrations possessed by a lens disposed in the direction of travel of an electron beam;
- at least two aberration-correcting elements disposed in said aberration corrector;
- and
- first and second control units for applying control voltages to the aberration-correcting elements disposed in the aberration corrector,
- wherein said second control unit produces its control voltage independent of said first control unit in such a way that the control voltage produced by the second control unit can be superimposed on the control voltage which is produced by the first control unit and to be applied to the aberration-correcting elements disposed in the aberration corrector, and
- wherein a higher-order aberration left in said lens after the lower-order aberrations possessed by the lens have been corrected by the control voltage applied by said first control unit is corrected using a combination aberration created by a combination of aberrations produced in the aberration-correcting elements disposed in the aberration corrector by the control voltage applied by the second control unit.
A charged-particle beam system comprising:
- an aberration corrector for correcting lower-order aberrations possessed by a lens disposed in the direction of travel of an electron beam;
- and
- a multipole element having a length in the direction of travel of the electron beam,
- wherein a higher-order aberration left in said lens after the lower-order aberrations possessed by the lens have been corrected by said aberration corrector is corrected by a higher-order aberration produced as tilt of the electron beam relative to an optical axis is varied when the beam travels through a field produced by the multipole element, and
- wherein the length of said multipole element taken in the direction of travel of the electron beam is set to such a value that the higher-order aberration left in said lens is corrected.
A method of correcting aberration possessed by a lens disposed in the direction of travel of an electron beam in a charged-particle beam system by means of an aberration corrector, said method comprising the steps of:
- placing plural aberration-correcting elements at intervals along a path of travel of the electron beam;
- and
- producing a combination aberration by combining aberrations produced in the aberration-correcting elements to correct a higher-order aberration left in said lens after lower-order aberrations possessed by the lens have been corrected by said aberration corrector.
Dependencies are inferred from the claim text.