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US 7,597,968 B2Granted
Substrate for pattern formation
AssigneeDai Nippon Printing Co., Ltd.
InventorYoshihiro Kobayashi
Life of this patent
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Abstract
A substrate for pattern formation, which includes a base material, a wettability inhibition part formed in a functional part formation region to be provided with a functional part on the base material, and a wettability inhibition examining part formed in a functional part non formation region without the functional part provided on the bases material is provided. The same constituent materials are used for the wettability inhibition part and the wettability inhibition examining part.
Claims6
A pattern formed body comprising:
- a substrate for pattern formation and a wettability changeable layer, wherein the substrate for pattern formation comprises:
- a base material,
- a wettability inhibition part formed in a functional part formation region on the base material, and
- a wettability inhibition examining part formed in a contact angle measuring region provided in a functional part non formation region on the base material,
- wherein the wettability changeable layer is formed on the wettability inhibition part and the wettability inhibition examining part of the substrate for pattern formation so as to have a wettability change by an action of a photocatalyst accompanied by an energy irradiation,
- wherein the pattern formed body further comprises a wettability changeable pattern comprising a lyophilic region and a liquid repellent region formed by directing the energy to the wettability changeable layer,
- wherein same constituent materials are used for the wettability inhibition part and the wettability inhibition examining part,
- wherein the functional part formation region comprises a region with the wettability inhibition part formed and a region with no wettability inhibition part formed, and the wettability changeable layer in the functional part formation region further comprises a lyophilic region and a liquid repellant region, and
- wherein the contact angle measuring region comprises a region with the wettability inhibition examining part formed and a region with no wettability inhibition examining part formed and the wettability changeable layer in the contact angle measuring region comprises only a lyophilic region.
6 more elements
Dependencies are inferred from the claim text.