Apparatus and method for determining air-kerma rate
AssigneeDornier MedTech Systems GmbH
InventorJürgen Neumann
Life of this patent
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Abstract
An apparatus for determining the air-kerma rate of an x-ray device comprises a data obtaining component for obtaining data of the x-ray device, a calculation component for calculating the air-kerma rate from the obtained data, and an outputting component for outputting the calculated air-kerma rate, where the calculation component uses an algebraic formula for the calculation of the air-kerma rate.
Claims33
An apparatus for determining the air-kerma rate of an x-ray device, comprising:
- a data obtaining component for obtaining data for the x-ray device;
- and
- a calculation component for calculating the air-kerma rate from the obtained data,
- wherein the calculation component uses an algebraic formula to calculate the air-kerma rate,
- wherein the algebraic formula for the air-kerma rate is:
- air-kerma rate=β*Uα*I+γ,
- wherein U is an operating voltage of an x-ray tube of the x-ray device, I is an operating current of the x-ray tube of the x-ray device, and α, β, and γ are calibration parameters.
A method for determining the air-kerma rate of an x-ray device, comprising the steps of:
- obtaining data of the operation of the x-ray device;
- and
- calculating via a calculation component the air-kerma rate from the obtained data,
- wherein the calculating step uses an algebraic formula to calculate the air-kerma rate,
- wherein the algebraic formula for the air-kerma rate is:
- air-kerma rate=β*Uα*I+γ,
- wherein U is an operating voltage of an x-ray tube of the x-ray device, I is an operating current of the x-ray tube of the x-ray device, and α, β, and γ are calibration parameters.
An apparatus for determining the air-kerma rate of an x-ray device, comprising:
- a data obtaining component for obtaining data for the x-ray device;
- and
- a calculation component for calculating the air-kerma rate from the obtained data,
- wherein the calculation component uses an algebraic formula to calculate the air-kerma rate,
- wherein the calculation component further calculates an air-kerma (AK) based on the calculated air-kerma rate (AKR), using one of the formulas
- AK=AKR*t or AK=AKR*t/(1+ε*exp(−τ*t)),
- wherein t is the irradiation time, and wherein ε and τ are calibration parameters.
A method for determining the air-kerma rate of an x-ray device, comprising the steps of:
- obtaining data of the operation of the x-ray device;
- and
- calculating via a calculation component the air-kerma rate from the obtained data,
- wherein the calculating step uses an algebraic formula to calculate the air-kerma rate,
- wherein the calculation step further comprises calculating via the calculation component an air-kerma (AK) based on the calculated air-kerma rate (AKR), using one of the formulas
- AK=AKR*t or AK=AKR*t/(1+ε*exp(−τ*t)),
- wherein t is the irradiation time, and wherein ε and τ are calibration parameters.
Dependencies are inferred from the claim text.