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US 7,596,985 B2Granted
Impact test apparatus
AssigneeFujitsu Limited
InventorOsamu Ido
Life of this patent
Estimating the term…
Abstract
An impact test apparatus allows a retaining member to retain a test object. The retaining member is attached to an elastic member. When a weight is made to collide against the test object, impact is applied to the test object. The test object is subjected to free oscillation in response to the impact. The elasticity of the elastic member accepts the movement of the retaining member. Damping of the free oscillation of the test object is minimized. The impact test sufficiently reflects the influence of the free oscillation.
Claims2
An impact test apparatus comprising:
- a support;
- a first magnet fixed to the support;
- a second magnet supported on the support for relative movement based on a repulsion between the first magnet and the second magnet;
- a retaining member attached to the second magnet so as to retain a test object;
- and
- a weight made to collide against the test object.
3 more elements
Dependencies are inferred from the claim text.