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US 7,594,338 B2Granted
Contour measuring probe for measuring aspects of objects
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsJian-Bin Kong, Qing Liu
Life of this patent
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Abstract
An exemplary contour measuring probe (10) includes a tip extension (16) and two driving members (13). The tip extension is configured for touching a surface of an object. The driving members are configured for driving the tip extension linearly moving along a first direction. The driving members are tapered and a diameter of each driving member increases along the first direction. The driving members are driven to move by gas pressure acting on an outer side surface thereof.
Claims14
A contour measuring probe, comprising:
- a tip extension for touching a surface of an object;
- and
- at least one driving member for driving the tip extension linearly to move along a first direction, the at least one driving member being tapered and having its diameter increasing along the first direction, and the at least one driving member driven to move by gas pressure acting on an outer side surface thereof.
Dependencies are inferred from the claim text.