Sample measuring device

A sample measuring device that measures light generated by irradiating energy beams on a sample, comprising:

• an energy beam generating part that generates energy beams,
• a electron optical column part that has an energy beam control device to converge the energy beams generated by the energy beam generating part and that converges the energy beams so as to make an axis of the energy beams coincide with an axis of the energy beam control device by the energy beam control device, and
• a light collecting mirror part that is arranged between the electron optical column part and the sample and that has an energy beam path to pass the energy beams converged by the electron optical column part and to irradiate the energy beams on the sample and a mirror face whose focal point is set on an axis of the energy beam path, and that collects the light generated from the sample by the mirror face, wherein
• the light collecting mirror part is supported by the electron optical column part so that the axis of the energy beams coincides with the focal point, and is provided with a positioning structure that makes it possible to mount and dismount the electron optical column part and the light collecting mirror part respectively, and that also makes the electron optical column part support the light collecting mirror part so that the axis of the energy beams coincides with the focal point by positioning an axial line of the energy beam control device and the axial line of the energy beam path coaxially.