Diagnostic method and system

A diagnostic system, comprising a computer processing means configured to:

• apply logic to select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive junction test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive dependent test result, identify a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;
• identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results;
• and
• determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results;
• and
• in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value;
• wherein the first and second parameter values comprise a test cost;
• and
• wherein the computer means is further configured to select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value, and order each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.

A method comprising:

• providing computer executable program code to be deployed to and executed on a computer system, wherein the computer executable program code is stored in a computer readable storage medium;
• the program code comprising instructions which, when executed on the computer system, causes the computer to:
• select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive function test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive dependent test result, identify a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;
• identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results;
• and
• determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results;
• and
• in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value, wherein the first and second parameter values comprise a test cost;
• select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value;
• and
• select each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.

A method for deploying an application for diagnosing a system-under-test, comprising providing a computer infrastructure being operable to:

• select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive function test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;
• responsive to a first series positive dependent test result, identity a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;
• identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results;
• and
• determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results;
• in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value, wherein the first and second parameter values comprise a test cost;
• select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value;
• and
• select each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.