Electrically stimulated fingerprint sensor test method
AssigneeTeradyne, Inc.
InventorFang Xu
Life of this patent
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Abstract
Systems and techniques for testing a fingerprint sensor are described. A conductive material is placed on a surface of the fingerprint sensor, and an electrical signal is applied to the conductive material. The electrical signal affects a first electrical property associated with first and second electrodes of the fingerprint sensor. First and second measurements of a second electrical property associated with the first and second electrodes are acquired, the second electrical property being correlated to the first electrical property. The first and second measurements are analyzed to determine whether the fingerprint sensor has one or more defects.
Claims18
A method for testing a fingerprint sensor, the method comprising:
- placing a conductive material over a surface of the fingerprint sensor;
- applying an electrical test signal to the conductive material, the electrical test signal affecting a first electrical property associated with first and second electrodes of the fingerprint sensor;
- acquiring first and second measurements of a second electrical property associated with the first and second electrodes, the second electrical property being related to the first electrical property;
- and
- determining that the fingerprint sensor has a defect based on an analysis of the first and second measurements.
A fingerprint sensor comprising:
- an array of electrodes;
- an electrically insulating material over a surface of the electrodes;
- and
- a continuously electrically conductive layer removably attached to the insulating material, the conductive material being configured to receive an electrical test signal for affecting an electrical property of the electrodes, the electrical property being usable to detect a defect in the fingerprint sensor.
Automatic test equipment for testing a fingerprint sensor, the automatic test equipment comprising:
- a testing device communicatively coupled to a conductive material associated with the fingerprint sensor, the testing device configured to:
- apply an electrical signal to the conductive material, the electrical signal for affecting a first electrical property associated with first and second electrodes of the fingerprint sensor, and
- acquire first and second measurements of a second electrical property associated with the first and second electrodes, the second electrical property being related to the first electrical property;
- and
- a processing device communicatively coupled to the testing device, the processing device configured to execute instructions to:
- determine that the fingerprint sensor has a defect on the basis of a difference between the first and second measurements exceeding a predetermined threshold.
Dependencies are inferred from the claim text.