Position measurement system
AssigneeFuji Xerox Co., Ltd.
InventorsYasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
Life of this patent
Estimating the term…
Abstract
A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
Claims12
A position measurement system for measuring positional coordinates of a point under measurement, the system comprising:
- one or more detectors configured to measure the point under measurement;
- and
- a computer configured to:
- process the measurements of the point under measurement to generate measured positional coordinates;
- perform a first noise removal process to remove noise from the measured positional coordinates to acquire first positional coordinate values;
- determine a noise removal parameter on a basis of the first positional coordinate values;
- and
- perform a second noise removal process to again remove noise from the first positional coordinate values by using the noise removal parameter, without again measuring the point under measurement, and to acquire second positional coordinate values,
- the computer outputting the second positional coordinate values.
A position measurement method for measuring positional coordinates of a point under measurement, the method comprising:
- measuring, by a positional measurement system, positional coordinates of the point under measurement;
- removing noise from the measured positional coordinates to compute first positional coordinate values;
- determining a noise removal parameter based on the first positional coordinate values;
- again removing noise from the first positional coordinate values using the determined noise removal parameter to compute second positional coordinate values;
- and
- determining second positional coordinates of the point under measurement on a basis of the second positional coordinate values without again measuring the point under measurement;
- and
- outputting the second positional coordinates.
A position measurement system for a presentation system, the position measurement system comprising:
- one or more detectors configured to measure an optically projected pattern;
- and
- a processor configured to:
- process the measurements of the pattern to generate initial positional coordinates,
- perform a first noise removal process to remove noise from the initial positional coordinates to acquire first noise-reduced positional coordinates,
- determine a noise removal parameter based on the first noise-reduced positional coordinates, and
- perform a second noise removal process to remove noise from the first noise-reduced positional coordinates using the noise removal parameter without again measuring the pattern, and to generate second noise-reduced positional coordinates,
- the projection system projecting a human-perceivable visual image at the second noise-reduced positional coordinates, and
- at least one of the first and second noise removal process uses a Kalman filter.
Dependencies are inferred from the claim text.