Testing of input/output devices of an integrated circuit

An integrated circuit, comprising:

• input/output circuits of an integrated circuit die associated with the integrated circuit, the input/output circuits having first input/output pads;
• the first input/output pads of the integrated circuit die being directly connected to one another, wherein the first input/output pads in combination are a first node for coupling to a first tester channel;
• the input/output circuits each respectively including:
• configuration circuitry coupled to one or more of the first input/output pads associated therewith;
• the configuration circuitry configurable to be in either a first mode or a second mode;
• the configuration circuitry including a first select circuit coupled to receive a first input for the first mode and a second input for the second mode;
• and
• the first select circuit configured for selecting between the first input and the second input for configuring the configuration circuitry for either the first mode or the second mode, the first select circuit of each of the input/output circuits controlled responsive to a first control select signal.