Contactor nest for an IC device and method
AssigneeEssai, Inc.
InventorsNasser Barabi, Oksana Kryachek, Chee-Wah Ho
Life of this patent
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AssigneeEssai, Inc.
InventorsNasser Barabi, Oksana Kryachek, Chee-Wah Ho
Estimating the term…
An improved contactor nest for receiving and holding IC devices against a pin board interposer during the test or burn-in of the devices includes a frame having an IC pocket with a top opening, which is oversized in relation to the footprint of the IC device for which the contactor is designed, and centering guide walls for guiding an IC device to be tested into the pocket from the oversized top opening to the IC device seating plane. The centering guide walls have a gradual angle relative to the insertion axis of the IC pocket, and extend down to a bottom perimeter portion of the IC pocket immediately adjacent the IC seating plane for gradually centering the IC device in the pocket as the IC device approaches the seating plane. Preferably, the angled guide walls extend far enough into the IC pocket to allow the spring pins of the pin board interposer to scrub the contact pads of the IC devices as the IC device is being centered.
An improved contactor nest for holding IC devices having contact pads against a pin board interposer having an array of conductive spring pins with protruding plunger ends, said contactor nest comprising:
An improved contactor nest for holding IC devices having contact pads against a pin board interposer having an array of conductive spring pins with protruding plunger ends, said contactor nest comprising:
A method of bringing contact pads of an IC device under test into electrical contact with spring pins of a pin board interposer situated at an IC device seating plane, comprising:
A method of bringing contact pads of an IC device under test into electrical contact with the spring pins of a pin board interposer situated at an IC device seating plane, comprising:
Dependencies are inferred from the claim text.