Rotation angle detecting device and method of correcting temperature characteristic of the same
AssigneeDenso Corporation
InventorsTakamitsu Kubota, Yoshiyuki Kono, Tomohiro Ito
Life of this patent
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Abstract
A method of correcting temperature characteristic of a rotation angle detecting device that includes a permanent magnet, a magnetic core, a Hall element that rotates relative to the permanent magnet when a rotating object rotates to provide an output signal. The method includes a step of setting temperature correction values for correcting a temperature characteristic of the rotation angle detecting device according to magnetic flux density. The magnetic flux density is divided into a plurality of grade ranges and the temperature correction values are respectively set for the grade ranges.
Claims2
A rotation angle detecting device for detecting a rotation angle of a rotating object comprising:
- magnet field forming means for forming a magnetic field;
- a Hall element, disposed in the magnetic field to rotate relative to the magnetic field when the rotating object rotates, for outputting voltage according to magnetic flux density of the magnetic field;
- setting means for setting a temperature characteristic correction value αi(t) at a temperature t for each one of a plurality of grade ranges of the magnetic flux density;
- a memory for storing the temperature characteristic correction value αi(t) for each one of a plurality of grade ranges of the magnetic flux density;
- correction means for correcting the temperature characteristic of said Hall element by the temperature characteristic correction value αi(t) that corresponds to a magnetic flux density to detect wherein said setting means sets the temperature characteristic correction value αi(t) in the following steps:
- measuring the output voltage V0 and Voff(t) of the Hall element under a magnetic flux density of 0 while the ambient temperature is a preset temperature t0 and a temperature t which changes in a preset range;
- obtaining ΔVoff that is a difference between Voff(t) and V0;
- forming a magnetic field of a certain magnetic flux density Bk as one of the grade ranges of the magnetic flux density;
- measuring an output voltage Vout(t) when the magnetic flux density is B0;
- calculating the magnetic flux density Bk from the following expression:
- Bk=(Vout(t)−V0)/S(t0) wherein S(t0) is an inclination of the output voltage to the magnetic flux density when the temperature is t0;
- setting the temperature characteristic correction value αk(t) to Vsen-off(t0)/Vsen-off(t) at the magnetic flux density of Bk, wherein Vsen-off(t0)=ΔVoff(t0)+Bk×S(t0) and Vsen-off(t)=ΔVoff(t)+Bk×S(t) and wherein S(t) is the inclination of the output voltage to the magnetic flux density when the temperature is t;
- and
- setting a temperature characteristic correction value αi(t) at the magnetic flux density being Bi by an expression:
- Vsen-off(t)=(Vout(t)−Voff(t))B=Bk×Bi/Bk+ΔVoff(t).
A method of correcting temperature characteristic of a rotation angle detecting device that includes field forming means for forming a magnetic field, a Hall element that rotates relative to the field forming means when a rotating object rotates to provide an output signal, said method comprising a step of setting temperature correction values for correcting a temperature characteristic of the rotation angle detecting device according to magnetic flux density wherein assuming that:
- the magnetic flux density is B;
- the ambient temperature of the rotation angle detecting device is t;
- the output voltage of the Hall element under the ambient temperature t is Vout(t);
- the offset voltage of the Hall element when the magnetic flux density is zero is Voff(t);
- the inclination of the output voltage to the magnetic flux density is S(t);
- a basic offset voltage under the ambient temperature of to is V0;
- a difference between the basic offset voltage V0and a current offset voltage Voff(t) is ΔVoff;
- Vsen-off(t) is defined as Vout(t)−V0=ΔVoff(t)+B×S(t), the temperature correction value α(t) is defined as follows:
- α(t)=Vsen-off(t0)/Vsen-off(t).
Dependencies are inferred from the claim text.