Method for producing a buried semiconductor layer
AssigneeInfineon Technologies Austria AG
InventorsRalf Siemieniec, Hans-Joachim Schulze, Franz Hirler
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Abstract
A method for producing a region of increased doping in an n-doped semiconductor layer which is buried in a semiconductor body of a vertical power transistor and which is arranged between a p-doped body region facing the front side contact of the power transistor and an n-doped substrate facing the rear side contact of the power transistor has the following steps: a) irradiation of at least one part of the surface of the semiconductor body with protons, and b) heat treatment of the semiconductor body.
Claims13
A method for producing a power transistor in a semiconductor body, the power transistor including an n-doped substrate, an n-doped semiconductor layer provided on the n- doped substrate, and a p-doped region provided within the upper region of the n-doped semiconductor layer, the method comprising:
- a) irradiating at least a part of a front side of the semiconductor body with protons, and
- b) heat treating the semiconductor body at a temperature of approximately between 450 C and 550 C, wherein by the heat treatment a region of increased n-doping is formed in the n-doped semiconductor layer between the n-doped substrate and the p-doped region, which contains proton-induced donors and which includes an essentially homogenous doping profile due to a combination of the irradiated protons with defects caused by irradiation, wherein the homogenous doping profile extends from a doping maximum and in the direction of the front side of the semiconductor body, wherein the region of increased n-doping in the upper region of the n-doped semiconductor layer is immediately adjacent to the p-doped body region.
Dependencies are inferred from the claim text.