Method for making split dual gate field effect transistor
AssigneeSemiconductor Manufacturing International (Shanghai) Corporation
InventorsDeyuan Xiao, Gary Chen, Tan Leong Seng, Roger Lee
Life of this patent
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Abstract
A method for making a semiconductor device with at least two gate regions. The method includes providing a substrate region including a surface. Additionally, the method includes forming a source region in the substrate region by at least implanting a first plurality of ions into the substrate region and forming a drain region in the substrate region by at least implanting a second plurality of ions into the substrate region. The drain region and the source region are separate from each other. Moreover, the method includes depositing a gate layer on the surface and forming a first gate region and a second gate region on the surface.
Claims23
A method for making a semiconductor device with at least two gate regions, the method comprising:
- providing a substrate region including a surface;
- implanting a first plurality of ions into the substrate region at a first dosage level to form a protective layer;
- implanting a second plurality of ions into the substrate region at a second dosage level to form an adjustment layer;
- forming a source region in the substrate region by at least implanting a third plurality of ions into the substrate region at a third dosage level, the third dosage level being higher than the first and second dosage levels, the source region partially overlapping the protective layer and the adjustment layer;
- forming a drain region in the substrate region by at least implanting a fourth plurality of ions into the substrate region at a fourth dosage level, the drain region and the source region being separate from each other, the fourth dosage level is higher than the first and second dosage level;
- depositing a gate layer on the surface;
- forming a first gate region and a second gate region on the surface;
- wherein the forming a first gate region and a second gate region includes forming an insulation region on the surface by at least removing a part of the gate layer, the first gate region and the second gate region being separated by the insulation region;
- wherein:
- the first gate region is capable of forming a first channel in the substrate region, the first channel from the source region to the drain region;
- the second gate region is capable of forming a second channel in the substrate region, the second channel from the source region to the drain region.
Dependencies are inferred from the claim text.