Substrate dividing method
AssigneeHamamatsu Photonics K.K.
InventorsYoshimaro Fujii, Fumitsugu Fukuyo, Kenshi Fukumitsu, Naoki Uchiyama
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AssigneeHamamatsu Photonics K.K.
InventorsYoshimaro Fujii, Fumitsugu Fukuyo, Kenshi Fukumitsu, Naoki Uchiyama
Estimating the term…
A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
A substrate dividing method comprising the steps of:
A method of manufacturing a semiconductor device formed using a substrate dividing method, the manufacturing method comprising:
A method of manufacturing a semiconductor device formed using a substrate dividing method, the manufacturing method comprising:
A substrate dividing method comprising the steps of:
A substrate dividing method comprising the steps of:
A method of manufacturing a semiconductor device formed using a substrate dividing method, the manufacturing method comprising:
A method of manufacturing a semiconductor device formed using a substrate dividing method, the manufacturing method comprising:
A substrate dividing method comprising the steps of:
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