Device and method for measuring jitter

A test device for measuring jitter, comprising:

• a data pattern generator operable to generate a data stream by modulation of an analog low-frequency basic signal with a sampling frequency fs, the basic signal having the basic frequency fc or a plurality of basic frequencies fci, the sampling frequency fs being greater than the basic frequency fc or the basic frequencies fci, and the modulation having a noise-shaping property;
• a first input terminal configured to connect to a data input of a semiconductor component to be tested;
• a clock generator operable to generate a test clock with the clock frequency ft that is equal to or an integer multiple of the sampling frequency fs;
• a jitter generator operable to generate jitter on a signal, the jitter generator being connected either between an output of the data pattern generator and the first input terminal or between the clock generator and a second input terminal for connecting to a clock input of the semiconductor component to be tested;
• an output terminal for connecting a data output of the semiconductor component to be tested to an input of an evaluation device;
• and
• the evaluation device which determines the jitter parameters from a low-frequency component of an input signal at the input of the evaluation device, the low-frequency component containing only frequency components of frequencies that are less than half the sampling frequency fs/2.