Automatic test equipment platform architecture using parallel user computers
AssigneeTestiary, Inc.
InventorsYun Jae Gil, Sung Jae Ghil, Steve Sooyoon Oh
Life of this patent
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Abstract
The present invention provides a system of testing semiconductor devices. The system comprises a central host computer, an array of user computers (the array), and a HU (Host-User) network as the mean of communication between them. Two user computers are dedicated to one test instrument via UI connections in the instrument test head, a first user computer can be assigned to perform the tasks of generating and delivering data to the test instrument, while a second user computer can be assigned to perform the tasks of receiving and processing information from the same test instrument.
Claims22
A system for testing a semiconductor device (DUT), comprising:
- first and second semiconductor test instruments that exercise the DUT;
- first and second user computers that monitor output of the test instruments;
- and
- a test head communicatively coupled to each of the user computers and to each of the test instruments, wherein the test head communicatively couples both the first and second user computers with the first test instrument.
A system for testing a semiconductor device (DUT), comprising:
- first and second semiconductor test instruments that exercise the DUT;
- first and second user computers that monitor output of the test instruments;
- and
- a test head communicatively coupled to each of the user computers and to each of the test instruments, wherein the test head communicatively couples both the first and second user computers with the first test instrument and wherein the first user computer communicates with second user computer via the test head.
A system for testing a semiconductor device (DUT), comprising:
- first and second semiconductor test instruments that exercise the DUT;
- first and second user computers that monitor output of the test instruments;
- a test head communicatively coupled to each of the user computers and to each of the test instruments, wherein the test head communicatively couples both the first and second user computers with the first test instrument and wherein the first user computer communicates with second user computer via the test head and the first user computer is programmed to:
- receive communication from the second user computer;
- generate test data for the first test instrument using the communication from the second user computer;
- and
- transfer the test data to the first test instrument.
Dependencies are inferred from the claim text.