Apparatus and method for determining the slew rate of a signal produced by an integrated circuit
AssigneeInternational Business Machines Corporation
InventorsChing-Te K. Chuang, Amlan Ghosh, Jae-Joon Kim, Rahul M. Rao
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Abstract
Determining a slew rate of a signal from an integrated circuit under test by comparing the signal with a first reference voltage, comparing the signal with a second reference voltage different from the first reference voltage, generating an output pulse having a pulse width indicative of a slew rate of the signal, and integrating the output pulse over time to generate an output voltage proportional to the pulse width; wherein the output voltage is indicative of the slew rate of the signal produced by the integrated circuit.
Claims7
An apparatus for determining a slew rate of a signal produced by an integrated circuit under test, the apparatus comprising:
- a first comparator for comparing the signal with a first reference voltage,
- a second comparator for comparing the signal with a second reference voltage different from the first reference voltage,
- an exclusive OR (XOR) gate operatively coupled to the first and second comparators for generating an output pulse having a pulse width indicative of a slew rate of the signal;
- an integrator for integrating the output pulse over time to generate an output voltage proportional to the pulse width;
- wherein the output voltage is indicative of the slew rate of the signal produced by the integrated circuit.
Dependencies are inferred from the claim text.