Semiconductor memory and operation method for same
AssigneeFujitsu Microelectronics Limited
InventorsKuninori Kawabata, Shuzo Otsuka
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AssigneeFujitsu Microelectronics Limited
InventorsKuninori Kawabata, Shuzo Otsuka
Estimating the term…
A bit line resetting signal is supplied to the gate of an nMOS transistor (or a precharge circuit) which connects a bit line with a precharge voltage line. The high-level voltage of the bit line resetting signal is retained at a first voltage during the precharge operation after a refresh operation, and is retained at a second voltage higher than the first voltage during the precharge operation after an access operation. In the precharge operation after the refresh operation, therefore, the second voltage is not used so that the current consumption of the generating circuit of the second voltage is reduced. Thus, it is possible to reduce the current consumption (or the standby current) during the standby period for which the internal refresh requests continuously occur.
A semiconductor memory comprising:
An operation control method for a semiconductor memory comprising a memory core including a precharge circuit which has dynamic memory cells, a bit line connected with said dynamic memory cells, and an nMOS transistor connecting said bit line to a precharge voltage line, the method comprising:
A semiconductor memory comprising:
Dependencies are inferred from the claim text.