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US 7,548,105 B2Granted
Method and apparatus for source synchronous testing
AssigneeIntegrated Device Technology, Inc.
InventorsRobert W. Shrank, Moussa Sobaiti, Prashant Shamarao, Brian Butka, Jim K. Harris
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Abstract
A method and apparatus for source synchronous testing have been disclosed. In one case a data signal is delayed and a selectively activated delay is applied to a clock. This allows the clock to be positioned before the data and also after the data.
Claims4
An apparatus comprising:
- means for receiving a clock signal;
- means for selectively delaying said received clock signal;
- means for receiving a data signal;
- means for selectively delaying said received data signal;
- means for comparing said selectively delayed received clock signal and said selectively delayed received data signal;
- means for generating a comparison output;
- and
- means for comparing said generated comparison output and an expected output.
5 more elements
Dependencies are inferred from the claim text.