System and method for controlling environmental parameters of a device under test

Abstract

The present invention is directed to a system and method to seal a device under test (DUT) into a portable chamber wherein the magnitude of the temperature, either up or down, is maintained by continuously providing a control signal applied to heating or cooling elements. In one embodiment, voltage polarity is used to select between heat and cold and voltage magnitude is used to control temperature. In one embodiment, several parameters within the chamber are monitored and the resultant signals are then used to define the magnitude and polarity of the control voltage. In one embodiment, a controller is used to receive information pertaining to the DUT. This information, for example, includes the identity of the DUT as well as its stabilization time and set temperature. The set temperature may be adjusted according to historical data pertaining to the DUT to compensate for differences over other test methods.

Dependencies are inferred from the claim text.