Signal measurement systems and methods
AssigneeMaury Microwave, Inc.
InventorGary R. Simpson
Life of this patent
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Abstract
An exemplary embodiment of a measurement system for conducting measurements on a device-under-test (DUT) includes a signal transmission line, an impedance controlling tuner including a signal transmission line segment as part of the signal transmission line, and a low-loss, electrically small signal coupling probe coupled to the signal transmission line in a non-contacting relationship for sampling signals propagating along the signal transmission line.
Claims36
A measurement system for conducting measurements on a device-under-test (DUT), wherein impedance is controlled or varied over a set of measurement conditions and a parameter or set of parameters measured for each measurement condition, the system comprising:
- a signal transmission line;
- an impedance controlling tuner including a signal transmission line segment as at least part of the signal transmission line;
- a low-loss, electrically small signal coupling probe coupled to said signal transmission line in a non-contacting relationship for coupling a sample portion of signals propagating along said signal transmission line to a probe connector or probe transmission line for transmission to a measurement equipment.
A load pull measurement system for conducting measurements on a device-under-test (DUT), wherein impedance is controlled or varied over a set of measurement conditions and a set of parameters measured for each measurement condition, the system comprising:
- a first signal transmission line connected to a first signal port of the DUT;
- a first impedance controlling tuner including a first signal transmission line segment as at least part of the first signal transmission line;
- a second signal transmission line connected to a second signal port of the DUT;
- a second impedance controlling tuner including a second signal transmission line segment as at least part of the second signal transmission line;
- a first low-loss, electrically small signal coupling probe coupled to the first transmission line in a non-contacting relationship for coupling a sample portion of signals propagating along said first transmission line to a first probe connector or probe transmission line for transmission to a measurement equipment;
- a second low-loss, electrically small signal coupling probe coupled to the second transmission line in a non-contacting relationship for coupling a sample portion of signals along said second transmission line to a second probe connector or probe transmission line for transmission to the measurement equipment.
Dependencies are inferred from the claim text.