Testing an electronic device using test data from a plurality of testers
AssigneeFormFactor, Inc.
InventorsIgor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller, A. Nicholas Sporck
Life of this patent
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Abstract
A method and apparatus for testing a set of electronic devices can comprise placing electronic devices into a test station. A plurality of testers can provide test data to the test station. The test station can test the electronic devices using test data received from the plurality of testers. One of the testers can communication with another of the testers regarding the testing of the electronic devices. Probes can be used to contact the electronic devices, and one of the electronic devices can be contacted by more than one of the probes.
Claims5
A test system comprising:
- a plurality of testers each configured to control testing of electronic devices, the plurality of testers comprising a first tester and a second tester;
- a test station configured to test a set of the electronic devices in accordance with test data received from the plurality of testers;
- and
- one or more communications links linking each of the testers to the test station, wherein:
- the first tester is configured to control testing of the set of electronic devices at the test station in accordance with a first type of testing;
- and
- the second tester is configured to control testing of the set of electronic devices at the test station in accordance with a second type of testing,
- wherein the second type of testing is different than the first type of testing.
A test system comprising:
- a plurality of testers each configured to control testing of electronic devices, the plurality of testers comprising a first tester and a second tester;
- a test station configured to test a set of the electronic devices in accordance with test data received from the plurality of testers;
- and
- one or more communications links linking each of the testers to the test station, wherein:
- the first tester is configured to control testing of the set of electronic devices at the test station in accordance with a first type of testing;
- and
- the second tester is configured to control testing of the set of electronic devices at the test station in accordance with a second type of testing,
- wherein the second type of testing is different than the first type of testing,
- wherein the first tester is configured to signal the second tester after completion of the first type of testing of the set of electronic devices at the test station.
Dependencies are inferred from the claim text.