Seek-scan probe (SSP) memory including mechanism for track correction

A system comprising:

• a processor having a first memory coupled thereto, wherein the first memory is selected from a group consisting of random access memory (RAM), dynamic random access memory (DRAM), synchronous random access memory (SRAM) and synchronous dynamic random access memory (SDRAM);
• and
• a second memory coupled to the processor, the second memory comprising:
• a substrate having one or more anchors formed thereon,
• a movable platform suspended by one or more tether beams from the one or more anchors,
• an actuator coupled to the movable platform,
• a micro-electro-mechanical (MEMS) probe having a proximal end, a distal end and a longitudinal axis extending between the proximal end and the distal end, wherein the proximal end is coupled to the movable platform and the distal end can be actuated in a direction substantially normal to a surface of the substrate, and
• a media mover supported above the MEMS probe and substantially parallel to the surface of the substrate, wherein the media mover moves relative to the substrate in one or both of a direction substantially parallel to the longitudinal axis of the MEMS probe and a direction substantially transverse to the longitudinal axis of the MEMS probe.

A process comprising:

• forming one or more anchors on a substrate;
• suspending a movable platform by one or more tether beams coupled to the one or more anchors;
• coupling an actuator to the movable platform;
• and
• coupling a micro-electro-mechanical (MEMS) probe to the movable platform, the MEMS probe having a proximal end, a distal end and a longitudinal axis extending between the proximal end and the distal end, wherein the proximal end is coupled to the movable platform and the distal end can be actuated in a direction substantially normal to a surface of the substrate.